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TLP3102 Datasheet, PDF (2/7 Pages) Toshiba Semiconductor – Measurement Equipment FA (Factory Automation) Power Line Control Security Equipment
TLP3102
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Forward current
Forward current derating (Ta ≥ 25°C)
LED
Reverse voltage
Junction temperature
Off-state output terminal voltage
On-state
current
A connection
B connection
C connection
Detector On-state A connection
current
derating
B connection
(Ta ≥ 50°C) C connection
On-state Current (Pulsed) (t=100ms)
Junction temperature
Storage temperature
Operating temperature
Lead soldering temperature (10 s)
Isolation voltage
(AC, 1 minute, R.H. ≤ 60%) (Note 1)
Symbol
IF
ΔIF/°C
VR
Tj
VOFF
ION
ΔION/°C
IONP
Tj
Tstg
Topr
Tsol
BVS
Rating
30
−0.3
5
125
40
2.5
2.5
5.0
−33.3
−33.3
−66.7
7.5
125
−55 to 125
−40 to 85
260
1500
Unit
mA
mA/°C
V
°C
V
A
mA/°C
A
°C
°C
°C
°C
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Device considered a two-terminal device: Pins 1, 2 and, 3 shorted together, and pins 4, 5 and 6 shorted
together.
Recommended Operating Conditions
Characteristics
Symbol
Min
Typ. Max Unit
Supply voltage
Forward current
Operating temperature
VDD
IF
Topr
⎯
⎯
40
V
⎯
7.5
20
mA
-20
⎯
65
°C
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
2
2014-09-01