TLP127_07 Datasheet, PDF (2/8 Pages) Toshiba Semiconductor – Photo−Transistor Programmable Controllers

Absolute Maximum Ratings (Ta = 25°C)
TLP127
Characteristic
Symbol
Rating
Unit
Forward current
Forward current derating
Pulse forward current
Reverse voltage
Junction temperature
Collector−emitter voltage
Emitter−collector voltage
Collector current
Collector power dissipation
Collector power dissipation
derating (Ta ≥ 25°C)
Junction temperature
Storage temperature range
Operating temperature range
Lead soldering temperature
Total package power dissipation
Total package power dissipation
derating (Ta ≥ 25°C)
Isolation voltage
(Note 1)
I_F
ΔI_F / °C
I_FP
V_R
T_j
V_CEO
V_ECO
I_C
P_C
ΔP_C / °C
T_j
T_stg
T_opr
T_sol
P_T
ΔP_T / °C
BV_S
50
−0.7 (Ta ≥ 53°C)
1 (100μs pulse, 100pps)
5
125
300
0.3
150
150
−1.5
125
−55~125
−55~100
260 (10s)
200
−2.0
2500 (AC, 1min., R.H.≤ 60%)
mA
mA / °C
A
V
°C
V
V
mA
mW
mW / °C
°C
°C
°C
°C
mW
mW / °C
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 1) Device considered a two terminal device: Pins 1, 3 shorted together and pins 4, 6 shorted together.
2
2007-10-01