TC74VHC20F_08 Datasheet, PDF (2/9 Pages) Toshiba Semiconductor – Dual 4-Input NAND Gate

Pin Assignment
TC74VHC20F/FN/FT/FK
IEC Logic Symbol
1A 1
1B 2
NC ₃
1C 4
1D 5
1Y 6
GND 7
(top view)
14 V_CC
13 2D
12 2C
11 NC
10 2B
9 2A
8 2Y
1A ⁽¹⁾
&
1B ⁽²⁾
1C ⁽⁴⁾
1D ⁽⁵⁾
2A ⁽⁹⁾
2B ⁽¹⁰⁾
2C ⁽¹²⁾
2D ⁽¹³⁾
(6) _1Y
(8) _2Y
Truth Table
Inputs
A
B
C
D
L
X
X
X
X
L
X
X
X
X
L
X
X
X
X
L
H
H
H
H
X: Don’t care
Output
Y
H
H
H
H
L
Absolute Maximum Ratings (Note)
Characteristics
Symbol
Rating
Unit
Supply voltage range
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC V_CC/ground current
Power dissipation
Storage temperature
V_CC
V_IN
V_OUT
I_IK
I_OK
I_OUT
I_CC
P_D
T_stg
−0.5 to 7.0
V
−0.5 to 7.0
V
−0.5 to V_CC + 0.5
V
−20
mA
±20
mA
±25
mA
±50
mA
180
mW
−65 to 150
°C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
2
2008-05-01