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CRS30I30A Datasheet, PDF (2/7 Pages) Toshiba Semiconductor – Schottky Barrier Diode
5. Thermal Characteristics
CRS30I30A
Characteristics
Thermal resistance (junction-to-ambient)
Symbol
Rth(j-a)
Thermal resistance (junction-to-lead)
Rth(j-ℓ)
Note
Test Condition
Max
Device mounted on a ceramic board
70
(board size: 50 mm × 50 mm)
(soldering land size: 2 mm × 2 mm)
(board thickness: 0.64 mm)
Device mounted on a glass-epoxy board 140
(board size: 50 mm × 50 mm)
(soldering land size: 6 mm × 6 mm)
(board thickness: 1.6 mm)
Junction to cathode lead
20
6. Electrical Characteristics (Unless otherwise specified, Ta = 25 )
Unit
/W
/W
Characteristics
Symbol Note
Test Condition
Min Typ. Max Unit
Peak forward voltage
Repetitive peak reverse current
Junction capacitance
VFM(1)
VFM(2)
VFM(3)
IRRM(1)
IRRM(2)
Cj
IFM = 0.5 A (pulse measurement)

0.30

V
IFM = 1 A (pulse measurement)

0.33

IFM = 3 A (pulse measurement)

0.40 0.49
VRRM = 5 V (pulse measurement)

14

µA
VRRM = 30 V (pulse measurement)

28
100
VR = 10 V, f = 1 MHz

82

pF
7. Marking
Marking Code
SR
Part Number
CRS30I30A
Fig. 7.1 Marking
2
2014-02-27
Rev.1.0