TA1304F Datasheet, PDF (15/31 Pages) Toshiba Semiconductor – TV-SOUND PROCESSOR

TA1304F/N
TEST CONDITION
NOTE
1
2
INPUT
POINT
TP6
TP8
↑
MEAS.
POINT
TP12
TP13
TP16
↑
BUS DATA (HEXADECIMAL)
00 01 02 03 04 05 06 07 ^SW1
TEST METHOD
40 40 72 00 72 40 * 10 (a) l Set data of sub address 03 (h) to 00
/
/
(h) and set data of sub address 07 (h)
to 10 (h).
04
90
l Input signal (1 kHz, 500 mV_rms, sine
wave) to TP6 and TP8.
l Measure amplitude of TP13 and
TP16 (v13₁ mV_rms, v16₁ mV_rms).
l Go R dB = 20 ℓog (v13₁ / 500)
Go L dB = 20 ℓog (v16₁ / 500)
l Set data of sub address 03 (h) to 04
(h).
l Measure amplitude of TP13 and
TP16 (v13₂ mV_rms, v16₂ mV_rms).
l GoAtt R dB = 20 ℓog (v13₂ / 13₁)
GoAtt L dB = 20 ℓog (v16₂ / 16₁)
l Set data of sub address 03 (h) to 00
(h) and set data of sub address 07 (h)
to 10 (h).
l Input signal (80 Hz, 125 mV_rms, sine
wave) to TP6 and TP8
l Measure amplitude of TP13 and
TP16 (v13₃ mV_rms, v16₃ mV_rms).
l Set data of sub address 07 (h) to 90
(h).
l Measure amplitude of TP13 and
TP16 (v13₄ mV_rms, v16₄ mV_rms).
l GoBst R dB = 20 ℓog (v13₄ / 13₃)
GoBst L dB = 20 ℓog (v16₄ / 16₃)
l Measure amplitude of TP12 (v12
mV_rms).
l Go W dB = 20 ℓog (v12 / 125)
↑ ↑ ↑ 00 ↑ ↑ * 10 ↑ l Input signal (1 kHz, 500 mV_rms, sine
wave) to TP6 and TP8
l Measure THD of TP13 and TP16
(THD R %, THD L %).
l Input signal (80 Hz, 125 mV_rms, sine
wave) to TP6 and TP8.
l Measure THD of TP12 (THD W %)
*:
Don’t care
2001-02-16 15/31