TC9457F Datasheet, PDF (12/15 Pages) Toshiba Semiconductor – Firmware Built In Digital Servo

I/O Ports (P1-0 to P4-3)
Characteristics
High level
Output current
Low level
Input leakage current
Input voltage
High level
Low level
Input pullup/down resistance
TC9457F
Symbol
I_OH3
I_OL3
I_OL5
I_LI
V_IH
V_IL
R_IN1
Test
Circuit
Test Condition
Min Typ. Max Unit
― V_OH = 4.5 V
―
V_OL = 0.5 V
(exclude P4-1, 2, 3 pin)
−1
−2
―
1.5
3.0
―
mA
― V_OL = 0.5 V (P4-1, 2, 3 pin)
4
10
―
― V_IH = 5.0 V, V_IL = 0 V
―
―
―
―
―
― ±1.0 µA
MV_DD
× 0.8
~
MV_DD
V
0
~
MV_DD
× 0.2
―
(P1-0 to P1-3) When pulldown,
pullup are set.
25
50 120 kΩ
HOLD ^{, INTR Input Port,} RESET ^Input
Characteristics
Symbol
Test
Circuit
Test Condition
Input leakage current
I_LI
― V_IH = 5.0 V, V_IL = 0 V
High level
V_IH3
―
―
Input voltage
Low level
V_IL3
―
―
Min Typ. Max Unit
―
― ±1.0 µA
MV_DD
× 0.8
~
MV_DD
V
0
~
MV_DD
× 0.2
A/D Converter (AD_IN1 to AD_IN4)
Characteristics
Symbol
Analog input voltage range
Resolution
Overall conversion error
V_AD
V_RES
―
Analog input leakage
I_LI
Test
Circuit
Test Condition
― AD_IN to AD_IN4
―
―
―
―
―
V_IH = 5.0 V, V_IL = 0 V
(AD_IN1 to AD_IN4)
Min Typ. Max Unit
0
~ MV_DD V
―
6
―
bit
― ±0.5 ±4.0 LSB
―
― ±1.0 µA
DATA, SFSY, LRCK, BCK, AOUT, MBOV, IPF Outputs and CLCK Input/Output
Characteristics
Output current
High level
Low level
Input leakage current
Input voltage
High level
Low level
Symbol
I_OH4
I_OL5
I_LI
V_IH
Test
Circuit
Test Condition
V_OH = 4.5 V
― (Settings OT for output,
LEDon = 0)
V_OL = 0.5 V
― (Settings OT for output,
LEDon = 0)
―
V_IH = 5.0 V, V_IL = 0 V
(CLCK)
― (CLCK)
V_IL
― (CLCK)
Min Typ. Max Unit
−2.0 −4.0 ―
mA
5
10
―
―
― ±1.0 µA
MV_DD
× 0.8
~
MV_DD
V
0
~
MV_DD
× 0.2
12
2002-10-21