English
Language : 

TPCP8402_07 Datasheet, PDF (1/11 Pages) Toshiba Semiconductor – TOSHIBA Field Effect Transistor Silicon P, N Channel MOS Type (U-MOS IV / U-MOS III)
TPCP8402
TOSHIBA Field Effect Transistor Silicon P, N Channel MOS Type (U-MOS IV / U-MOS III)
TPCP8402
Portable Equipment Applications
Motor Drive Applications
DC-DC Converter Applications
• Lead(Pb)-Free
• Low drain-source ON resistance : P Channel RDS (ON) = 60 mΩ (typ.)
N Channel RDS (ON) = 38 mΩ (typ.)
• High forward transfer admittance : P Channel |Yfs| = 6.0 S (typ.)
N Channel |Yfs| = 7.0 S (typ.)
• Low leakage current : P Channel IDSS = −10 μA (VDS = −30 V)
N Channel IDSS = 10 μA (VDS = 30 V)
• Enhancement mode
: P Channel Vth = −0.8 to −2.0 V (VDS = −10 V, ID = −1mA)
N Channel Vth = 1.3 to 2.5 V (VDS = 10 V, ID = 1mA)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Drain-source voltage
Drain-gate voltage (RGS = 20 kΩ)
Gate-source voltage
Drain
current
DC
Pulse
(Note 1)
(Note 1)
Drain power Single-device operation
dissipation
(Note 3a)
(t = 5 s)
Single-device value at
(Note 2a) dual operation (Note 3b)
Drain power Single-device operation
dissipation
(Note 3a)
(t = 5 s)
Single-device value at
(Note 2b) dual operation (Note 3b)
VDSS
VDGR
VGSS
ID
IDP
PD (1)
PD (2)
PD (1)
PD (2)
−30
−30
±20
−3.4
−13.6
1.48
1.23
0.58
0.36
30
V
30
V
±20
V
4.2
A
16.8
1.48
1.23
W
0.58
0.36
Single pulse avalanche energy
(Note 4)
EAS
0.75
2.86
mJ
Avalanche current
IAR
−1.7
2.1
A
Repetitive avalanche energy
Single-device value at dual operation
EAR
0.12
mJ
(Note 2a, 3b, 5)
Channel temperature
Storage temperature range
Tch
150
°C
Tstg
−55~150
°C
Note: For Notes 1 to 6, refer to the next page.
Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in temperature,
etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage,
etc.) are within the absolute maximum ratings. Please design the
appropriate reliability upon reviewing the Toshiba Semiconductor
Reliability Handbook (“Handling Precautions”/Derating Concept and
Methods) and individual reliability data (i.e. reliability test report and
estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with caution.
0.33±0.05
0.05 M A
8
5
Unit: mm
0.475 1
4
0.65
2.9±0.1
S
0.025 S
0.17±0.02
B
0.05 M B
A
0.8±0.05
0.28
+0.1
-0.11
1.12+-00..1132
1.12+-00..1132
1.Source1
2.Gate1
3.Source2
4.Gate2
JEDEC
5.Drain2
6.Drain2
7.Drain1
8.Drain1
0.28
+0.1
-0.11
―
JEITA
―
TOSHIBA
2-3V1G
Weight: 0.017 g (typ.)
Circuit Configuration
8
7
6
5
1
2
3
4
Marking (Note 6)
876
5
8402
*
123
4
Lot No.
1
2006-11-13