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TPCP8201_07 Datasheet, PDF (1/7 Pages) Toshiba Semiconductor – TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS III)
TPCP8201
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS III)
TPCP8201
Portable Equipment Applications
Motor Drive Applications
DC-DC Converter Applications
• Lead(Pb)-Free
• Low drain-source ON resistance: RDS (ON) = 38 mΩ (typ.)
• High forward transfer admittance:|Yfs| = 7.0 S (typ.)
• Low leakage current: IDSS = 10 μA (VDS = 30 V)
• Enhancement mode: Vth = 1.3 to 2.5 V (VDS = 10 V, ID = 1mA)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Drain-source voltage
Drain-gate voltage (RGS = 20 kΩ)
Gate-source voltage
DC
Drain current
Pulse
(Note 1)
(Note 1)
Drain power
dissipation
(t = 5 s)
(Note 2a)
Single-device operation
(Note 3a)
Single-device value at
dual operation
(Note 3b)
Drain power
dissipation
(t = 5 s)
(Note 2b)
Single-device operation
(Note 3a)
Single-device value at
dual operation
(Note 3b)
Single pulse avalanche energy
(Note 4)
Avalanche current
Repetitive avalanche energy
Single-device value at dual operation
(Note 2a, 3b, 5)
Channel temperature
Storage temperature range
Symbol
VDSS
VDGR
VGSS
ID
IDP
PD (1)
PD (2)
PD (1)
PD (2)
EAS
IAR
EAR
Tch
Tstg
Rating
Unit
30
V
30
V
±20
V
4.2
A
16.8
1.48
1.23
W
0.58
0.36
2.86
mJ
2.1
A
0.12
mJ
150
°C
−55~150
°C
0.33±0.05
0.05 M A
8
5
Unit: mm
0.475 1
4
0.65
2.9±0.1
S
0.025 S
0.17±0.02
B
0.05 M B
A
0.8±0.05
0.28
+0.1
-0.11
1.12
+0.13
-0.12
1.12
+0.13
-0.12
1.Source1 5.Drain2
2.Gate1 6.Drain2
3.Source2 7.Drain1
4.Gate2 8.Drain1
JEDEC
0.28
+0.1
-0.11
―
JEITA
―
TOSHIBA
2-3V1G
Weight: 0.017 g (typ.)
Circuit Configuration
8
7
6
5
1
2
3
4
Note: For Notes 1 to 6, refer to the next page.
Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in temperature,
etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage,
etc.) are within the absolute maximum ratings. Please design the
appropriate reliability upon reviewing the Toshiba Semiconductor
Reliability Handbook (“Handling Precautions”/Derating Concept and
Methods) and individual reliability data (i.e. reliability test report and
estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with caution.
Marking (Note 6)
876
5
8201
*
123
4
Lot No.
1
2007-01-16