TPCA8009-H_07 Datasheet, PDF (1/7 Pages) Toshiba Semiconductor – High Speed Switching Applications

TPCA8009-H
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (MACHⅡπ-MOSⅤ)
TPCA8009-H
High Speed Switching Applications
Switching Regulator Applications
DC/DC Converter Applications
Unit: mm
1.27 ^0.4±0.1
8
5
0.05 M A
• Small footprint due to a small and thin package
• High-speed switching
• Small gate charge: QSW = 3.7 nC (typ.)
• Low drain-source ON-resistance: R_{DS (ON)} = 0.23Ω (typ.)
• High forward transfer admittance: |Y_fs| = 4.5S (typ.)
• Low leakage current: I_DSS = 100 μA (max) (V_DS = 150 V)
• Enhancement mode: V_th = 2.0 to 4.0 V (V_DS = 10 V, I_D = 1 mA)
0.15±0.05
1
4
5.0±0.2
0.595
A
0.05 S
S
1
4
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Drain-source voltage
Drain-gate voltage (R_GS = 20 kΩ)
Gate-source voltage
Drain current
DC (Note 1)
Pulsed (Note 1)
Drain power dissipation (Tc=25℃)
Drain power dissipation
(t = 10 s)
(Note 2a)
Drain power dissipation
(t = 10 s)
(Note 2b)
Single-pulse avalanche energy
(Note 3)
Avalanche current
Repetitive avalanche energy
(Tc=25℃) (Note 4)
Channel temperature
Storage temperature range
Symbol
V_DSS
V_DGR
V_GSS
I_D
I_DP
P_D
P_D
P_D
E_AS
I_AR
E_AR
T_ch
T_stg
Rating
Unit
150
V
150
V
±20
V
7
A
14
45
W
2.8
W
1.6
W
34
mJ
7
A
1.5
mJ
150
°C
−55 to 150
°C
4.25±0.2
8
5 _0.8±0.1
1, 2, 3 : SOURCE
4 : GATE
5, 6, 7, 8 : DRAIN
JEDEC
―
JEITA
―
TOSHIBA
2-5Q1A
Weight: 0.068 g (typ.)
Circuit Configuration
8765
1234
Note: For Notes 1 to 4, refer to the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and
Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with care.
1
2007-12-18