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TC7WH74FK_09 Datasheet, PDF (1/7 Pages) Toshiba Semiconductor – D-Type flip flop with preset and clear
TC7WH74FU/FK
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7WH74FU,TC7WH74FK
D-Type flip flop with preset and clear
Features
• High speed: fMAX = 170 MHz (typ.) at VCC = 5V
• Low power dissipation: ICC = 2μA (max) at Ta = 25°C
• High noise immunity: VNIH = VNIL = 28% VCC (min)
• 5.5-V tolerant inputs
• Balanced propagation delays: tpLH ∼− tpHL
• Wide operating voltage range: VCC = 2 to 5.5V
Marking
SM8
H74
US8
Product Name
Lot No.
WH
74
TC7WH74FU
TC7WH74FK
(SM8)
(US8)
Weight
SSOP8-P-0.65: 0.02 g (typ.)
SSOP8-P-0.50A: 0.01 g (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Pin Assignment (top view)
Supply voltage
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC VCC/ground current
Power dissipation
Storage temperature
Lead temperature (10 s)
VCC
−0.5 to 7.0
V
VIN
−0.5 to 7.0
V
VOUT
−0.5 to VCC + 0.5
V
IIK
−20
mA
IOK
±20 ( Note 1)
mA
IOUT
±25
mA
ICC
±50
mA
300 (SM8)
PD
mW
200 (US8)
Tstg
−65 to 150
°C
TL
260
°C
VCC PR CLR Q
8 7 65
CK D
12
Q GND
34
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: VOUT < GND、VOUT > VCC
1
2009-09-28