TC7WH02FK_09 Datasheet, PDF (1/7 Pages) Toshiba Semiconductor – Dual 2-Input NOR Gate

TC7WH02FU/FK
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7WH02FU,TC7WH02FK
Dual 2-Input NOR Gate
Features
• High speed operation
• Low power dissipation
: t_pd = 3.6ns (typ.)
at V_CC = 5V, C_L = 15pF
: I_CC = 2μA (max) at Ta = 25°C
• High noise immunity
: V_NIH = V_NIL = 28% V_CC (min)
• Operating voltage range : V_CC = 2 to 5.5V
• Balanced propagation delays : t_pLH ≒ t_pHL
• 5.5-V Tolerant inputs
• Identical pin assignment and function with TC7W02
TC7WH02FU
TC7WH02FK
(SM8)
Marking
SM8
H 02
Product Name
US8
Lot No.
WH
02
Absolute Maximum Ratings (Ta = 25°C)
Weight
SSOP8-P-0.65
SSOP8-P-0.50A
(US8)
: 0.02 g (typ.)
: 0.01 g (typ.)
Characteristics
Symbol
Rating
Unit
Supply voltage
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC V_CC/GND current
Power dissipation
Storage temperature
Lead Temperature (10s)
V_CC
V_IN
V_OUT
I_IK
I_OK
I_OUT
I_CC
P_D
T_stg
T_L
−0.5 to 7.0
V
−0.5 to 7.0
V
−0.5 to VCC+0.5
V
−20
mA
±20 (Note 1) mA
±25
mA
±50
mA
300 (SM8)
mW
200 (US8)
−65 to 150
°C
260
°C
Pin Assignment (top view)
1A 1
1B 2
2Y 3
GND 4
8 V_CC
7 1Y
6 2B
5 2A
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: V_OUT < GND, V_OUT > V_CC
1
2009-09-24