TC7W241FUTE12LF Datasheet, PDF (1/6 Pages) Toshiba Semiconductor – TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic

TC7W241FU
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7W241FU
Non-Inverted, 3-State Outputs
The TC7W241FU is a high speed C²MOS Dual Bus Buffers
fabricated with silicon gate C²MOS technology.
It achieves the high speed operation similar to equivalent
LSTTL while maintaining the C²MOS low power dissipation.
It is a non-inverting 3-state buffer has one active-high and one
active-low output enable.
All inputs are equipped with protection circuits against static
discharge or transient excess voltage.
Features
• High speed: t_pd = 10 ns (typ.) at V_CC = 5 V
• Low power dissipation: I_CC = 2 μA (max) at Ta = 25°C
• High noise immunity: V_NIH = V_NIL = 28% V_CC (min)
• Output drive capability: 15 LSTTL loads
• Symmetrical output impedance: |I_OH| = I_OL = 6 mA (min)
• Balanced propagation delays: t_pLH ^∼− t_pHL
• Wide operating voltage range: V_CC (opr) = 2 to 6 V
Weight: 0.02 g (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Supply voltage range
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC V_CC/ground current
Power dissipation
Storage temperature range
Lead temperature (10 s)
V_CC
V_IN
V_OUT
I_IK
I_OK
I_OUT
I_CC
P_D
T_stg
T_L
−0.5 to 7
V
−0.5 to V_CC + 0.5
V
−0.5 to V_CC + 0.5
V
±20
mA
±20
mA
±35
mA
±37.5
mA
300
mW
−65 to 150
°C
260
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2009-09-30