TC7S32F_09 Datasheet, PDF (1/7 Pages) Toshiba Semiconductor – TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic

TC7S32F/FU
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7S32F, TC7S32FU
2-Input OR Gate
Features
• High Speed
• Low power dissipation
• High noise immunity
: t_{pd =} 7ns (typ.) at V_CC = 5 V
: I_CC = 1 μA (max) at Ta = 25°C
: V_NIH = V_NIL = 28% V_CC (min)
• Output drive capability : 5 LSTTL Loads
• Symmetrical Output Impedance : |I_OH| = I_OL= 2mA (min)
• Balanced propagation delays : t_pLH ≒ t_pHL
• Wide operating voltage range : V_CC = 2 to 6 V
Marking
E4
Product name
TC7S32F
TC7S32FU
(SMV)
(USV)
Absolute Maximum Ratings (Ta = 25°C)
Weight
SSOP5-P-0.95
SSOP5-P-0.65A
: 0.016 g (typ.)
: 0.006 g (typ.)
Characteristics
Symbol
Supply voltage
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC V_CC/ground current
Power dissipation
Storage temperature
Lead temperature (10 s)
V_CC
V_IN
V_OUT
I_IK
I_OK
I_OUT
I_CC
P_D
T_stg
T_L
Rating
−0.5 to 7.0
−0.5 to V_CC + 0.5
−0.5 to V_CC + 0.5
±20
±20
±12.5
±25
200
−65 to 150
260
Unit
Pin Assignment (top view)
V
V
V
IN B 1
5 V_CC
mA
mA
IN A 2
mA
mA
GND 3
4 OUT Y
mW
°C
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
1
2009-08-05