TC7S04F_09 Datasheet, PDF (1/7 Pages) Toshiba Semiconductor – TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic

Inverter
TC7S04F/FU
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7S04F,TC7S04FU
The TC7S04 is a high speed C²MOS Inverter fabricated with
silicon gate C²MOS technology.
It achieves high speed operation similar to equivalent LSTTL
while maintaining the C²MOS low power dissipation.
The internal circuit is composed of 3 stages including buffer
output, which enables high noise immunity and stable output.
The input is equipped with protection circuits against static
discharge or transient excess voltage.
Output currents are 1/2 compared to TC74HC series models.
TC7S04F
Features
• High speed: t_pd = 7 ns (typ.) at V_CC = 5 V
• Low power dissipation: I_CC = 1 μA (max) at Ta = 25°C
• High noise immunity: V_NIH = V_NIL = 28% V_CC (min)
• Output drive capability: 5 LSTTL loads
• Symmetrical output impedance: |I_OH| = I_OL = 2 mA (min)
• Balanced propagation delays: t_pLH ^∼− t_pHL
• Wide operating voltage range: V_CC (opr) = 2 to 6 V
Absolute Maximum Ratings (Ta = 25°C)
TC7S04FU
Weight
SSOP5-P-0.95: 0.016 g (typ.)
SSOP5-P-0.65A: 0.006 g (typ.)
Characteristics
Symbol
Rating
Unit
Supply voltage range
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC V_CC/ground current
Power dissipation
Storage temperature range
Lead temperature (10 s)
V_CC
V_IN
V_OUT
I_IK
I_OK
I_OUT
I_CC
P_D
T_stg
T_L
−0.5 to 7
V
−0.5 to V_CC + 0.5
V
−0.5 to V_CC + 0.5
V
±20
mA
±20
mA
±12.5
mA
±25
mA
200
mW
−65 to 150
°C
260
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2009-09-30