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TBAV99 Datasheet, PDF (1/5 Pages) Toshiba Semiconductor – Switching Diodes Silicon Epitaxial Planar
Switching Diodes Silicon Epitaxial Planar
TBAV99
1. Applications
• Ultra-High-Speed Switching
2. Packaging and Internal Circuit
TBAV99
SOT23
1: Anode 1
2: Cathode 2
3: Cathode1 / Anode 2
3. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Note
Rating
Unit
Peak reverse voltage
VRM
85
V
Reverse voltage
VR
80
Peak forward current
IFM
(Note 1)
300
mA
Average rectified current
IO
(Note 1)
100
Power dissipation
PD
150
mW
Power dissipation
PD
(Note 2)
320
mW
Non-repetitive peak forward surge current
IFSM (Note 1), (Note 3)
2
A
Junction temperature
Tj
125

Storage temperature
Tstg
-55 to 125

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Unit rating. Total rating = Unit rating × 70 %
Note 2: Device mounted on a 25.4 mm × 25.4 mm × 1.6 mm FR-4 glass epoxy board (Cu pad: 0.42 mm2 × 3)
Note 3: Measured with a 10 ms pulse.
©2015 Toshiba Corporation
1
Start of commercial production
2014-12
2015-11-26
Rev.2.0