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SSM5N16FU Datasheet, PDF (1/5 Pages) Toshiba Semiconductor – High Speed Switching Applications
SSM5N16FU
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type
SSM5N16FU
High Speed Switching Applications
Analog Switching Applications
Unit: mm
• Suitable for high-density mounting due to compact package
• Low on resistance: Ron = 3.0 Ω (max) (@VGS = 4 V)
: Ron = 4.0 Ω (max) (@VGS = 2.5 V)
: Ron = 15 Ω (max) (@VGS = 1.5 V)
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 Common)
Characteristics
Symbol
Rating
Unit
Drain-Source voltage
VDS
20
V
Gate-Source voltage
VGSS
±10
V
Drain current
DC
Pulse
ID
100
mA
IDP
200
Drain power dissipation (Ta = 25°C)
PD(Note 1)
200
mW
JEDEC
―
Channel temperature
Tch
150
°C
Storage temperature range
Tstg
−55~150
°C
JEITA
―
Note: Using continuously under heavy loads (e.g. the application of
TOSHIBA
2-2L1B
high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are
within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Total rating
Marking
Equivalent Circuit
5
4
5
4
DS
Q1
Q2
1
2
3
1
2
3
Handling Precaution
When handling individual devices (which are not yet mounting on a circuit board), be sure that the environment
is protected against electrostatic electricity. Operators should wear anti-static clothing, and containers and other
objects that come into direct contact with devices should be made of anti-static materials.
1
2007-11-01