RN2967CT Datasheet, PDF (1/6 Pages) Toshiba Semiconductor – Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN2967CT~RN2969CT
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)
RN2967CT,RN2968CT,RN2969CT
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications
• Two devices are incorporated into a fine pitch Small Mold (6 pin)
package.
• Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enable the manufacture of ever more
compact equipment and save assembly cost.
• Complementary to RN1967CT to RN1969CT
1.0±0.05
0.15±0.03
Unit: mm
６
５
４
１
２
３
0.35±0.02 0.35±0.02
0.7±0.03
0.075±0.03
Equivalent Circuit and Bias Resistor Values
C
Type No.
R1 (kΩ)
R2 (kΩ)
R1
B
RN2967 CT
10
47
RN2968 CT
22
47
RN2969 CT
47
22
E
1.EMIITTER1 (E1)
2.EMITTER2 (E2)
3.BASE2
(B2)
4.COLLECTOR2 (C2)
5.BASE1
(B1)
CST6 _{6.COLLECTOR1 (C1)}
JEDEC
―
JEITA
―
TOSHIBA
2-1K1A
Weight: 1.0 mg (typ.)
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common)
Characteristics
Symbol
Rating
Unit
Collector-base voltage
RN2967CT
V_CBO
−20
V
to
Collector-emitter voltage _RN2969CT
V_CEO
−20
V
RN2967CT
−6
Emitter-base voltage
RN2968CT
V_EBO
−7
V
RN2969CT
−15
Collector current
I_C
−50
mA
Collector power dissipation ^RN2967CT P_C (Note1)
50
mW
to
Junction temperature
RN2969CT
T_j
150
°C
Storage temperature range
T_stg
−55 to 150 °C
Equivalent Circuit
(top view)
654
Q1
Q2
123
Note 1: Total rating
Note 2:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2010-05-27