RN2907FS Datasheet, PDF (1/6 Pages) Toshiba Semiconductor – Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN2907FS~RN2909FS
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)
RN2907FS,RN2908FS,RN2909FS
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications.
• Two devices are incorporated into a fine pitch small mold (6-pin)
package.
• Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enables the manufacture of ever more
compact equipment and lowers assembly cost.
• Complementary to RN1907FS to RN1909FS
Equivalent Circuit and Bias Resistor Values
0.1±0.05
Unit: mm
1.0±0.05
0.8±0.05
0.1±0.05
1
6
2
5
3
4
C
R1
B
E
Type No.
RN2907FS
RN2908FS
RN2909FS
R1 (kΩ)
10
22
47
R2 (kΩ)
47
47
22
1₁.E_.EM_MIT_IIT_TE_TR_E1_{R1 (E}(₁E₎1)
2₂.B_.EA_MSE_IT1_{TER2 (E}(₂B₎1)
ffSS6
3456_{345....ECCB...CBBMAOOOAASLILSSTLELLEETLEE2E21ECCRCTT2TOOORRR122 (((BCB}((((₂₂₂CCEB_)))2221))))
6.COLLECTOR1 (C1)
JEDEC
―
JEITA
―
TOSHIBA
2-1F1D
Weight: 1 mg (typ.)
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 common)
Equivalent Circuit (top view)
Characteristics
Symbol
Rating
Unit
Collector-base voltage
Collector-emitter voltage
RN2907FS to
RN2909FS
RN2907FS
Emitter-base voltage
RN2908FS
RN2909FS
Collector current
Collector power dissipation _{RN2907FS to}
Junction temperature
RN2909FS
Storage temperature range
V_CBO
V_CEO
V_EBO
I_C
P_C*
T_j
T_stg
−20
V
−20
V
−6
−7
V
−15
−50
mA
50
mW
150
°C
−55 to 150 °C
654
Q1
Q2
123
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
*: Total rating
1
2010-07-08