RN2907AFS Datasheet, PDF (1/6 Pages) Toshiba Semiconductor – Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN2907AFS~RN2909AFS
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Transistor with Built-in Bias Resistor)
RN2907AFS, RN2908AFS, RN2909AFS
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications
• Two devices are incorporated into a fine-pitch, small-mold (6-pin)
package.
• Incorporating a bias resistor into a transistor reduces the parts count.
Reducing the parts count enables the manufacture of ever more
compact equipment and lowers assembly costs.
• Complementary to the RN1907AFS to RN1909AFS
Equivalent Circuit and Bias Resistor Values
0.1±0.05
1.0±0.05
0.8±0.05
Unit: mm
0.1±0.05
1
6
2
5
3
4
C
R1
B
E
Type No.
RN2907AFS
RN2908AFS
RN2909AFS
R1 (kΩ)
10
22
47
R2 (kΩ)
47
47
22
1. EMITTER1 ^(E1)
2. BASE1
(B1)
3. COLLECTOR2 ^(C2)
4. EMITTER2 ^(E2)
5. BASE2
(B2)
fS6 ^{6. COLLECTOR1 (C1)}
JEDEC
―
JEITA
―
TOSHIBA
2-1F1D
Weight: 1 mg (typ.)
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 common)
Characteristic
Symbol
Rating
Unit
Collector-base voltage
V_CBO
−50
V
RN2907AFS to RN2909AFS
Collector-emitter voltage
V_CEO
−50
V
RN2907AFS
−6
Emitter-base voltage
RN2908AFS
V_EBO
−7
V
RN2909AFS
−15
Collector current
I_C
−80
mA
Collector power dissipation
P_C (Note 1)
50
mW
RN2907AFS to RN2909AFS
Junction temperature
T_j
150
°C
Storage temperature range
T_stg
−55 to 150 °C
Equivalent Circuit
(top view)
654
Q1
Q2
123
Note:
Note 1:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Total rating
1
2010-05-14