RN2321A Datasheet, PDF (1/11 Pages) Toshiba Semiconductor – Silicon PNP Epitaxial Type (PCT Process) Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications

RN2321A∼RN2327A
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)
RN2321A,RN2322A,RN2323A,RN2324A
RN2325A,RN2326A,RN2327A
Switching, Inverter Circuit, Interface Circuit
And Driver Circuit Applications
z High current driving is possible.
z Since bias resisters are built in the transistor, the miniaturization of the
apparatus by curtailment of the number of parts and laborsaving of an
assembly are possible.
z Many kinds of resistance value are lined up in order to support various
kinds of circuit design.
z Complementary to RN1321A~RN1327A
z Low V_CE(sat) enable to be low power dissipation on high current driving.
Unit in mm
Equivalent Circuit And Bias Resistance Values
Type No.
RN2321A
RN2322A
RN2323A
RN2324A
RN2325A
RN2326A
RN2327A
R1 (kΩ)
1
2.2
4.7
10
0.47
1
2.2
R2 (kΩ)
1
2.2
4.7
10
10
10
10
1.BASE
2.EMITTER
3.COLLECTOR
JEDEC
―
JEITA
SC-70
TOSHIBA
2-2E1A
Weight: 0.006 g (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Collector power dissipation
Junction temperature
Storage temperature range
RN2321A~2327A
RN2321A~2324A
RN2325A, 2326A
RN2327A
RN2321A~2327A
V_CBO
V_CEO
V_EBO
I_C
P_C
T_j
T_stg
−15
V
−12
V
−10
−5
V
−6
−500
mA
100
mW
150
°C
−55~150
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
1
2007-11-01