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RN2112ACT Datasheet, PDF (1/6 Pages) Toshiba Semiconductor – Switching Applications Inverter Circuit Applications Interface Circuit Applications Driver Circuit Applications | |||
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RN2112ACT,RN2113ACT
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor Built-in Transistor)
RN2112ACT,RN2113ACT
Switching Applications
Inverter Circuit Applications
Interface Circuit Applications
Driver Circuit Applications
⢠Extra small package (CST3) is applicable for extra high density
fabrication.
⢠Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enables the manufacture of ever more
compact equipment and lowers assembly cost.
⢠Complementary to RN1112CT, RN1113CT
Equivalent Circuit
C
R1
B
E
Absolute Maximum Ratings (Ta = 25°C)
0.6±0.05
0.5±0.03
Unit: mm
ï¼
ï¼
ï¼
0.35±0.02
0.15±0.03
0.05±0.03
CST3
1.BASE
2.EMITTER
3.COLLECOTR
JEDEC
â
JEITA
â
TOSHIBA
2-1J1A
Weight: 0.75 mg (typ.)
Characteristics
Symbol
Rating
Unit
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Collector power dissipation
Junction temperature
Storage temperature range
VCBO
VCEO
VEBO
IC
PC
Tj
Tstg
â50
V
â50
V
â5
V
â80
mA
100 *
mW
150
°C
â55 to 150
°C
* : Mounted on FR4 board (10 mm à 10 mm à 1 mmt)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e.operatingtemperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(âHandling Precautionsâ/âDerating Concept and Methodsâ) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
1
2009-04-17
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