RN1961CT Datasheet, PDF (1/8 Pages) Toshiba Semiconductor – Switching Applications Inverter Circuit Applications Interface Circuit Applications Driver Circuit Applications

RN1961CT~RN1966CT
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)
RN1961CT,RN1962CT,RN1963CT
RN1964CT,RN1965CT,RN1966CT
Switching Applications
Inverter Circuit Applications
Interface Circuit Applications
Driver Circuit Applications
• Two devices are incorporated into a fine pitch Small Mold (6 pin)
package.
• Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enable the manufacture of ever more
compact equipment and save assembly cost.
• Complementary to RN2961CT to RN2966CT
Equivalent Circuit and Bias Resistor Values
C
R1
B
E
Type No.
RN1961CT
RN1962CT
RN1963CT
RN1964CT
RN1965CT
RN1966CT
R1 (kΩ)
4.7
10
22
47
2.2
4.7
R2 (kΩ)
4.7
10
22
47
47
47
1.0±0.05
0.15±0.03
Unit: mm
６
５
４
１
２
３
0.35±0.02 0.35±0.02
0.7±0.03
0.075±0.03
CST6
1.EMITTER1 ^(E1)
2.EMITTER2 ^(E2)
3.BASE2
(B2)
4.COLLECTOR2 ^(C2)
5.BASE1
(B1)
6.COLLECTOR１ ^(C1)
JEDEC
JEITA
TOSHIBA
―
―
2-1K1A
Weight: 1 mg (typ.)
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 common)
Equivalent Circuit
(top view)
Characteristics
Symbol
Rating
Unit
65 4
Collector-base voltage
Collector-emitter voltage
RN1961CT
to 1966CT
Emitter-base voltage
RN1961CT
to 1964CT
RN1965CT,
1966CT
Collector current
Collector power dissipation ^RN1961CT
to
Junction temperature
RN1966CT
Storage temperature range
V_CBO
20
V
V_CEO
20
V
10
V_EBO
V
5
I_C
50
mA
P_C (Note1)
50
mW
T_j
150
°C
T_stg
−55 to 150 °C
Q1
Q2
123
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note1: Total rating
1
2009-04-14