RN1901FS Datasheet, PDF (1/8 Pages) Toshiba Semiconductor – Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN1901FS~RN1906FS
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor Built-in Transistor)
RN1901FS,RN1902FS,RN1903FS
RN1904FS,RN1905FS,RN1906FS
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications
• Two devices are incorporated into a fine pitch small mold (6-pin)
package.
• Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enables the manufacture of ever more
compact equipment and lowers assembly cost.
• Complementary to RN2901FS~RN2906FS
0.1±0.05
Unit: mm
1.0±0.05
0.8±0.05
0.1±0.05
1
6
2
5
3
4
Equivalent Circuit and Bias Resistor Values
C
R1
B
E
Type No.
RN1901FS
RN1902FS
RN1903FS
RN1904FS
RN1905FS
RN1906FS
R1 (kΩ)
4.7
10
22
47
2.2
4.7
R2 (kΩ)
4.7
10
22
47
47
47
1.EMIITTER1 (E1)
2.BASE1
(B1)
3.COLLECTOR2 (C2)
4. EMIITTER2 (E2)
5.BASE2
(B2)
fS6 6.COLLECTOR1 (C1)
JEDEC
―
JEITA
―
TOSHIBA
2-1F1D
Weight: 0.001g (typ.)
Absolute Maximum Ratings (Ta = 25°C)
(Q1, Q2 common)
Characteristics
Symbol
Rating
Unit
Collector-base voltage
RN1901FS~
V_CBO
20
V
Collector-emitter voltage
1906FS
V_CEO
20
V
RN1901FS~
1904FS
10
Emitter-base voltage
V_EBO
V
RN1905FS,
1906FS
5
Collector current
I_C
50
mA
Collector power dissipation _RN1901FS~ P_C (Note 1)
50
mW
Junction temperature
RN1906FS
T_j
150
°C
Storage temperature range
T_stg
−55~150
°C
Equivalent Circuit
(top view)
654
Q1
Q2
123
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Total rating
1
2007-11-01