RN1701JE Datasheet, PDF (1/8 Pages) Toshiba Semiconductor – Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN1701JE~RN1706JE
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Bias Resistor Built-in Transistor)
RN1701JE,RN1702JE,RN1703JE
RN1704JE,RN1705JE,RN1706JE
Switching, Inverter Circuit, Interface Circuit and
Driver Circuit Applications
Unit: mm
• Two devices are incorporated into an Extreme-Super-Mini (5 pin)
package.
• Incorporating a bias resistor into a transistor reduces parts count.
Reducing the parts count enables the manufacture of ever more compact
equipment and lowers assembly cost.
• A wide range of resistor values is available for use in various circuit
designs.
• Complementary to RN2701JE~RN2706JE
Equivalent Circuit and Bias Resistor Values
C
R1
B
E
Type No.
RN1701JE
RN1702JE
RN1703JE
RN1704JE
RN1705JE
RN1706JE
R1 (kΩ)
4.7
10
22
47
2.2
4.7
R2 (kΩ)
4.7
10
22
47
47
47
1.BASE1
(B1)
2.EMITTER (E)
3.BASE2
(B2)
4.COLLECTOR2 (C2)
5.COLLECTOR1 (C1)
JEDEC
―
JEITA
―
TOSHIBA
2-2P1D
Weight: 0.003 g (typ.)
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common)
Characteristics
Symbol
Rating
Unit
Collector-base voltage
RN1701JE~
V_CBO
50
V
Collector-emitter voltage
1706JE
V_CEO
50
V
RN1701JE~
1704JE
10
Emitter-base voltage
V_EBO
V
RN1705JE,
RN1706JE
5
Collector current
I_C
100
mA
Collector power dissipation _RN1701JE~ P_C (Note 1) 100
mW
Junction temperature
1706JE
T_j
150
°C
Storage temperature range
T_stg
−55~150 °C
Equivalent Circuit
(top view)
5
4
Q1
Q2
123
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Total rating
1
2007-11-01