JDH3D01S Datasheet, PDF (1/4 Pages) Toshiba Semiconductor – Diode Silicon Epitaxial Schottky Barrier Type For wave detection

TOSHIBA Diode Silicon Epitaxial Schottky Barrier Type
JDH3D01S
○ For wave detection
¾ Small package
JDH3D01S
Unit: mm
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Reverse voltage
Forward current
Junction temperature
Storage temperature range
V_R
4
V
I_F
25
mA
T_j
125
°C
T_stg
−55~125
°C
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the
Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/Derating Concept and Methods) and individual
reliability data (i.e. reliability test report and estimated failure rate,
etc).
1 ^SSï½±^Mﾉｰﾄ¹ï¾ž^. 1^ANODE1
2. CATHODE2
2 ｶｿｰ₃ﾄ_.ﾞ 2_{CATHODE1/ANODE2}
3 ｶｿｰﾄﾞ 1/ｱﾉｰﾄﾞ 2
JEDEC
―
JEITA
―
TOSHIBA
1-2S1C
Weight:0.0024g(typ.)
Electrical Characteristics (Ta = 25°C)
Characteristic
Forward voltage
Forward current
Reverse current
Capacitance
Symbol
V_F
I_F
I_R
C_T
Test Condition
I_F = 2 mA
V_F = 0.5 V
V_R = 0.5 V
V_R = 0.2 V, f = 1 MHz
Min Typ. Max Unit
⎯ 0.25 ⎯
V
25
⎯
⎯
mA
⎯
⎯
25
uA
⎯
0.6
⎯
pF
Marking
BH
Caution
This device is sensitive to electrostatic discharge. Operators should wear antistatic clothing, and containers and
other objects that come into direct contact with the product should be made of antistatic materials.
1
2007-11-01