GT50J322_06 Datasheet, PDF (1/6 Pages) Toshiba Semiconductor – SILICON N CHANNEL IGBT FOURTH GENERATION IGBT

GT50J322
TOSHIBA INSULATED GATE BIPOLAR TRANSISTOR SILICON N CHANNEL IGBT
GT50J322
FOURTH GENERATION IGBT
CURRENT RESONANCE INVERTER SWITCHING
APPLICATIONS
Unit: mm
z FRD included between emitter and collector
z Enhancement mode type
z High speed
: t_f = 0.25μs (Typ.) (I_C = 50A)
z Low saturation voltage : V_{CE (sat)} = 2.1V (Typ.) (I_C = 50A)
ABSOLUTE MAXIMUM RATINGS (Ta = 25°C)
CHARACTERISTIC
SYMBOL
RATING
UNIT
Collector−Emitter Voltage
Gate−Emitter Voltage
DC
Collector Current
1ms
Emitter-Collector Foward ^DC
Current
1ms
Collector Power Dissipation
(Tc = 25°C)
Junction Temperature
Storage Temperature Range
V_CES
V_GES
I_C
I_CP
I_F
I_FP
P_C
T_j
T_stg
600
V
±20
V
50
A
100
30
A
60
130
W
150
°C
−55~150
°C
JEDEC
⎯
JEITA
⎯
TOSHIBA
2-21F2C
Weight: 9.75 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
EQUIVALENT CIRCUIT
MARKING
TOSHIBA
GT50J322
JAPAN
Part No. (or abbreviation code)
Lot No.
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
1
2006-11-01