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GT20J321_06 Datasheet, PDF (1/7 Pages) Toshiba Semiconductor – Silicon N Channel IGBT High Power Switching Applications
GT20J321
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
GT20J321
High Power Switching Applications
Fast Switching Applications
Unit: mm
• Fourth-generation IGBT
• Enhancement mode type
• Fast switching (FS): Operating frequency up to 50 kHz (reference)
High speed: tf = 0.04 μs (typ.)
Low switching loss : Eon = 0.40 mJ (typ.)
: Eoff = 0.43 mJ (typ.)
• Low saturation voltage: VCE (sat) = 2.0 V (typ.)
• FRD included between emitter and collector
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Collector-emitter voltage
Gate-emitter voltage
Collector current
Emitter-collector forward
current
Collector power dissipation
(Tc = 25°C)
Junction temperature
Storage temperature range
DC
1 ms
DC
1 ms
VCES
VGES
IC
ICP
IF
IFM
PC
Tj
Tstg
600
V
±20
V
20
A
40
20
A
40
45
W
150
°C
−55 to 150
°C
JEDEC
―
JEITA
―
TOSHIBA
2-10R1C
Weight: 1.7 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Thermal Characteristics
Characteristics
Thermal resistance (IGBT)
Thermal resistance (diode)
Symbol
Rth (j-c)
Rth (j-c)
Max
Unit
2.78
°C/W
4.23
°C/W
Equivalent Circuit
Marking
Collector
Gate
Emitter
20J321
1
Part No. (or abbreviation code)
Lot No.
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
2006-11-01