|
DF5A6.2LFU Datasheet, PDF (1/3 Pages) Toshiba Semiconductor – Product for Use Only as Protection against Electrostatic Discharge (ESD). | |||
|
DF5A6.2LFU
TOSHIBA Diodes for Protecting against ESD Epitaxial Planar Type
DF5A6.2LFU
Product for Use Only as Protection against Electrostatic
Discharge (ESD).
Unit: mm
* This product is for protection against electrostatic discharge (ESD)
only and is not intended for any other usage, including without
limitation, the constant voltage diode application.
z The mounting of four devices on an ultra-compact package allows the
number of parts and the mounting cost to be reduced.
z Low terminal capacitance (between Cathode and Anode)
: CT = 6.5 pF (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
1.CATHODE 1
Power dissipation
P
200
mW
2. ANODE
3.CATHODE2
Junction temperature
Storage temperature range
Tj
125
°C
4.CATHODE3
5.CATHODE4
Tstg
â55~125
°C
JEDEC
â¯
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
JEITA
â¯
temperature, etc.) may cause this product to decrease in the
TOSHIBA
1-2V1B
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
Weight: 0.0062 g (typ.)
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(âHandling Precautionsâ/âDerating Concept and Methodsâ) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Electrical Characteristics (Ta = 25°C)
Characteristic
Zener voltage
Dynamic impedance
Reverse current
Terminal capacitance
(between Cathode and Anode)
Symbol
VZ
ZZ
IR
CT
Test Condition
IZ = 5 mA
IZ = 5 mA
VR = 5 V
VR = 0 V, f=1 MHz
Min Typ. Max Unit
5.9 6.2 6.5
V
â
â
50
Ω
â
â
2.5
μA
â
6.5
â
pF
Guaranteed Level of ESD Immunity
Test Condition
ESD Immunity Level
IEC61000-4-2
(Contact discharge)
Criterion: No damage to device elements
± 8 kV
1
2007-11-01
|
▷ |