DF5A3.6CFU Datasheet, PDF (1/3 Pages) Toshiba Semiconductor – Product for Use Only as Protection against Electrostatic Discharge (ESD)

DF5A3.6CFU
TOSHIBA Diodes for Protecting against ESD Epitaxial Planar Type
DF5A3.6CFU
Product for Use Only as Protection against Electrostatic
Discharge (ESD)
Unit: mm
* This product is for protection against electrostatic discharge (ESD) only
and is not intended for any other usage, including without limitation,
the constant voltage diode application.
z The mounting of four devices on an ultra-compact package allows the
number of parts and the mounting cost to be reduced.
z Low terminal capacitance : C_T =52 pF (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Power dissipation
Junction temperature
P
200
mW
T_j
150
°C
1.CATHODE 1
2. ANODE
Storage temperature range
T_stg
−55~150
°C
3.CATHODE2
4.CATHODE3
Note: Using continuously under heavy loads (e.g. the application of high
5.CATHODE4
temperature/current/voltage and the significant change in
JEDEC
⎯
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
JEITA
⎯
operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the
TOSHIBA
1-2V1B
Weight: 0.0062 g (typ.)
Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and
estimated failure rate, etc).
Electrical Characteristics (Ta = 25°C)
Characteristic
Zener voltage
Dynamic impedance
Reverse current
Terminal capacitance
(between Cathode and Anode)
Symbol
V_Z
Z_Z
I_R
C_T
Test Condition
I_Z = 5 mA
I_Z = 5 mA
V_R = 1.8 V
V_R = 0 V, f = 1 MHz
Min Typ. Max Unit
3.4 3.6 3.8
V
―
―
130
Ω
―
― 100 μA
⎯
52
⎯
pF
Guaranteed Level of ESD Immunity
Test Condition
IEC61000-4-2
(Contact discharge)
ESD Immunity Level
± 15 kV
Criterion: No damage to device elements
1
2007-11-01