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1SS382_07 Datasheet, PDF (1/3 Pages) Toshiba Semiconductor – Ultra High Speed Switching Application
TOSHIBA Diode Silicon Epitaxial Planar Type
1SS382
1SS382
Ultra High Speed Switching Application
Unit: mm
z Small package
z Composed of 2 independent diodes.
z Low forward voltage
: VF (3) = 0.92V (typ.)
z Fast reverse recovery time : Trr = 1.6ns (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Maximum (peak) reverse Voltage
Reverse voltage
Maximum (peak) forward current
VRM
VR
IFM
85
V
80
V
300 *
mA
Average forward current
IO
100 *
mA
Surge current (10ms)
IFSM
2
A
Power dissipation
P
100 *
mW
Junction temperature
Tj
125
°C
Storage temperature range
Tstg
−55~125
°C
JEDEC
―
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
EIAJ
TOSHIBA
―
1-2U1A
temperature, etc.) may cause this product to decrease in the
Weight: 0.006g
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
*:
Unit rating. Total rating = unit rating × 1.5
Electrical Characteristics (Ta = 25°C)
Characteristic
Forward voltage
Reverse current
Total capacitance
Reverse recovery time
Symbol
VF (1)
VF (2)
VF (3)
IR (1)
IR (2)
CT
trr
Test
Circuit
Test Condition
― IF = 1mA
― IF = 10mA
― IF = 100mA
― VR = 30V
― VR = 80V
― VR = 0, f = 1MHz
― IF = 10mA, Fig.1
Min Typ. Max Unit
― 0.61 ―
V
― 0.74 ―
V
―
0.92 1.20
V
―
―
0.1
μA
―
―
0.5
μA
―
0.9 2.0
pF
―
1.6 4.0
ns
Pin Assignment (Top View)
Marking
1
2007-11-01