THS4524-EP_17 Datasheet, PDF (9/48 Pages) Texas Instruments – VERY LOW POWER, NEGATIVE RAIL INPUT, RAIL-TO-RAIL OUTPUT, FULLY DIFFERENTIAL AMPLIFIER

www.ti.com
1000000
THS4524-EP
SBOS609A – JUNE 2012 – REVISED AUGUST 2013
100000
10000
Wirebond Life
Electromigration Fail Mode
(Output current = 15 mA)
Electromigration Fail Mode
(Output current = 25 mA)
Electromigration Fail Mode
(Output current = 40 mA)
1000
125
130
135
140
145
150
Continuous T_J (°C)
A. See datasheet for absolute maximum and minimum recommended operating conditions.
B. Silicon operating life design goal is 10 years at 105°C junction temperature (does not include package interconnect
life).
Figure 1. Electromigration Fail Mode/Wirebond Life Derating Chart
Copyright © 2012–2013, Texas Instruments Incorporated
Product Folder Links :THS4524-EP
Submit Documentation Feedback
9