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BQ24765 Datasheet, PDF (9/36 Pages) Texas Instruments – SMBus-Controlled Multi-Chemistry Battery Charger With Integrated Power MOSFETs
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bq24765
SLUS999 – NOVEMBER 2009
ELECTRICAL CHARACTERISTICS (continued)
7.0 V ≤ V(DCINA) ≤ 24 V, 0°C < TJ < +125°C, typical values are at TA = 25°C, with respect to AGND (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
CHARGE UNDERCURRENT COMPARATOR (Cycle-by-Cycle Synchronous to Non-Synchronous)
VUCP
Cycle-by-cycle Synchronous to
Non-Synchronous Transition
Threshold
Cycle-by-cycle, (CSOP-CSON) voltage, falling,
LGATE turns-off and latches off until next cycle
5
10
15
mV
LOGIC INPUT PIN CHARACTERISTICS (CE, SDA, SCL)
VIN_LO
VIN_HI
Input low threshold voltage
Input high threshold voltage
Pull-up CE with ≥ 2kΩ resistor, or connect directly to
VREF.
2.1
0.8
V
V
VBIAS
Input bias current
V = 0 to 7V
OPEN-DRAIN LOGIC OUTPUT PIN CHARACTERISTICS (ACOK, ICOUT)
1
μA
VOUT_LO
Output low saturation voltage
VDDSMB INPUT SUPPLY FOR SMBUS
Sink Current = 5 mA
0.5
V
VVDDSMB_RANGE
VVDDSMB_UVLO_
Threshold_Rising
VVDDSMB_UVLO_
Hyst_Rising
IVDDSMB_Iq
VDDSMB input voltage range
VDDSMB undervoltage lockout
threshold voltage, rising
VDDSMB undervoltage lockout
hysteresis voltage, falling
VDDSMB quiescent current
VVDDSMB Rising
VVDDSMB Falling
VVDDSMB = SCL = SDA = 3.3 V
2.7
5.5
V
2.4
2.5
2.6
V
100
150
200
mV
20
30
μA
SMB TIMING SPECIFICATIONS
PARAMETER
tR
tF
tW(H)
tW(L)
tSU(STA)
tH(STA)
SCLK/SDATA rise time
SCLK/SDATA fall time
SCLK pulse width high
SCLK Pulse Width Low
Setup time for START condition
START condition hold time after which first
clock pulse is generated
tSU(DAT)
tH(DAT)
tSU(STOP)
t(BUF)
Data setup time
Data hold time
Setup time for STOP condition
Bus free time between START and STOP
condition
FS(CL)
Clock Frequency
HOST COMMUNICATION FAILURE
ttimeout
SMBus bus release timeout
tBOOT
Deglitch for watchdog reset signal
tWDI
Watchdog timeout period
OUTPUT BUFFER CHARACTERISTICS
V(SDAL) Output LO voltage at SDA, I(SDA) = 3 mA
TEST CONDITIONS
MIN TYP MAX UNIT
1 µs
300 ns
4
50 µs
4.7
µs
4.7
µs
4
µs
250
ns
300
ns
4
µs
4.7
µs
10
100 kHz
22
25 35 ms
10
ms
140 170 200
s
0.4 V
Copyright © 2009, Texas Instruments Incorporated
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