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LMH6644-MIL Datasheet, PDF (8/28 Pages) Texas Instruments – Low-Power, 130-MHz, 75-mA Rail-to-Rail Output Amplifier
LMH6644-MIL
SNOSD65 – JUNE 2017
www.ti.com
7.6 5-V Electrical Characteristics
Unless otherwise specified, all limits ensured for V+ = 5 V, V– = 0 V, VCM = VO = V+/2, VID (input differential voltage) as noted
(where applicable) and RL = 2 kΩ to V+/2
PARAMETER
TEST CONDITIONS
AT TEMPERATURE
EXTREMES
V+ = 5 V, V– = 0 V,
VCM = VO = V+/2, VID
RL = 2 kΩ to V+/2
UNIT
MIN
TYP
MAX
MIN (1) TYP (2) MAX(1)
BW
BW0.1dB
PBW
–3-dB BW
0.1-dB gain
flatness
Full power
bandwidth
AV = +1, VOUT = 200mVPP
AV = +2, –1, VOUT = 200mVPP
AV = +2, RL = 150Ω to V+/2,
Rf = 402Ω, VOUT = 200mVPP
AV = +1, –1dB, VOUT = 2VPP
90
120
46
15
22
MHz
MHz
MHz
en
Input-referred
voltage noise
f = 100kHz
f = 1kHz
17
nV/√Hz
48
in
Input-referred
current noise
f = 100kHz
f = 1kHz
0.90
pA/√Hz
3.3
THD
Total harmonic
distortion
f = 5MHz, VO = 2VPP, AV = +2
–60
dBc
DG
DP
CT Rej.
TS
SR
VOS
Differential gain
Differential
phase
Cross-talk
rejection
Settling time
Slew rate (3)
Input offset
voltage
NTSC, AV = +2
RL =150Ω to V+/2
RL = 1kΩ to V+/2
NTSC, AV = +2
RL = 150Ω to V+/2
RL = 1kΩ to V+/2
f = 5MHz, receiver:
Rf = Rg = 510Ω, AV = +2
VO = 2VPP, ±0.1%, 8pF Load
AV = –1, VI = 2VPP
0.16%
0.05%
0.05
deg
0.01
47
dB
68
95
125
ns
V/µs
±7
±1
±5 mV
TC VOS
Input offset
average drift
See (4)
±5
µV/°C
IB
Input bias
current
See (5)
–3.25
–1.70 –2.60 µA
IOS
Input offset
current
1000
20
800 nA
RIN
Common-mode
input resistance
3
MΩ
Common-mode
CIN
input
capacitance
2
pF
CMVR
Input common-
mode voltage
range
CMRR ≥ 50dB
–0.1
–0.5
–0.2
V
3.6
3.8
4.0
CMRR
Common-mode
rejection ratio
VCM Stepped from 0V to 3.5V
72
95
dB
AVOL
Large signal
voltage gain
VO = 0.5V to 4.50V
RL = 2kΩ to V+/2
VO = 0.5V to 4.25V
RL = 150Ω to V+/2
82
72
86
98
dB
76
82
(1) All limits are ensured by testing or statistical analysis.
(2) Typical values represent the most likely parametric norm.
(3) Slew rate is the average of the rising and falling slew rates.
(4) Offset voltage average drift determined by dividing the change in VOS at temperature extremes by the total temperature change.
(5) Positive current corresponds to current flowing into the device.
8
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