ISO1176T_13 Datasheet, PDF (8/27 Pages) Texas Instruments – Isolated Profibus RS-485 Transceiver with Integrated Transformer Driver

ISO1176T
SLLSE28F – OCTOBER 2010 – REVISED OCTOBER 2012
PARAMETER MEASUREMENT INFORMATION (continued)
V_CC1
DE
0 or II
V_CC1
D
GND 1
VI
GND 1
IOA
A
B
GND 2
IOB
VOB
GND 2
VOD ^{54 W}
VOA
Figure 8. Input Voltage Hysteresis Test Circuit
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DE
A
I_OS
250
D
GND1
B
I_OS
GND2
V_{_+OS}
135
60
t_(CFB)
t_(TSD)
time
Figure 9. Driver Short-Circuit Test Circuit and Waveforms (Short Circuit applied at Time t=0)
V_CC1
DE
A
D
Input
Generator
VI
50 W
B
GND1
Generator: PRR= 500 kHz , 50 % duty
cycle, tr < 6ns , t _f < 6 ns ,ZO = 50 W
V_OD
RL = 54 W
±1 %
C_{L = 50 pF}
± _20%
C _{L includes fixture and}
instrumentation capacitance
V_I
1.5 V
t_pLH
90 %
V_OD
0V
10 %
tr
Figure 10. Driver Switching Test Circuit and Waveforms
3V
1.5 V
t_pHL
90%
tf
V_OD(H)
0V
10 %
V_OD(L)
V_CC1
DE
A
D
Input
Generator
VI
50 W
B
R_L=±514%W
C_L
=
±
50pF
20%
A
VO B ^tt(MHL)
GND1
Generator : PRR= 500 kHz, 50 % duty
cycle, t _r< 6ns ^, tf <6 ns ,ZO = 50W
GND2
V_{OA VOB}
CLincludes fixture and
instrumentation capacitance
50 %
50 %
50 %
t_t(MLH)
50 %
Figure 11. Driver Output Transition Skew Test Circuit and Waveforms
V_IN = 0V ^D
DE
Signal
Generator
50 W
GND 1
R_L= 110 W
V_CC2
A
C_L= 50 pF
B
R_L= 110 W
0V
V_OA V_OB
C_L= 50 pF
GND 2
DE
t_(AZL)
A
t_(BZH)
B
1.5 V
50%
50%
t_(ALZ)
VOL+ 0.5V
t_(BHZ)
VOH - 0.5 V
Figure 12. Driver Enable/Disable Test, D at Logic Low Test Circuit and Waveforms
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