TLC393_13 Datasheet, PDF (7/31 Pages) Texas Instruments – DUAL MICROPOWER LinCMOS VOLTAGE COMPARATOR

TLC193, TLC393
DUAL MICROPOWER LinCMOS VOLTAGE COMPARATOR
SLCS115E − DECEMBER 1986 − REVISED JULY 2003
switching characteristics, V_DD = 5 V, T_A = 25°C (see Figure 3)
PARAMETER
TEST CONDITIONS
tPLH Propagation delay time, low-to-high-level output
tPHL Propagation delay time, high-to-low-level output
tf
Fall time, output
Overdrive = 2 mV
f = 10 kHz,
CL = 15 pF
Overdrive = 5 mV
Overdrive = 10 mV
Overdrive = 20 mV
Overdrive = 40 mV
VI = 1.4-V step at IN +
Overdrive = 2 mV
f = 10 kHz,
CL = 15 pF
Overdrive = 5 mV
Overdrive = 10 mV
Overdrive = 20 mV
Overdrive = 40 mV
VI = 1.4-V step at IN +
f = 10 kHz,
CL = 15 pF
Overdrive = 50 mV
TLC393C, TLC393I
TLC393Q, TLC193M,
TLC393M
MIN TYP MAX
4.5
2.5
1.7
1.2
1.1
1.1
3.6
2.1
1.3
0.85
0.55
0.10
22
UNIT
µs
µs
ns
PARAMETER MEASUREMENT INFORMATION
The TLC393 contains a digital output stage which, if held in the linear region of the transfer curve, can cause
damage to the device. Conventional operational amplifier/comparator testing incorporates the use of a servo
loop that is designed to force the device output to a level within this linear region. Since the servo-loop method
of testing cannot be used, the following alternatives for testing parameters such as input offset voltage,
common-mode rejection ratio, etc., are suggested.
To verify that the input offset voltage falls within the limits specified, the limit value is applied to the input as shown
in Figure 1(a). With the noninverting input positive with respect to the inverting input, the output should be high.
With the input polarity reversed, the output should be low.
A similar test can be made to verify the input offset voltage at the common-mode extremes. The supply voltages
can be slewed as shown in Figure 1(b) for the V_ICR test, rather than changing the input voltages, to provide
greater accuracy.
5V
1V
+
5.1 kΩ
+
5.1 kΩ
Applied VIO
Limit
−
VO
Applied VIO
Limit
−
VO
−4V
(a) VIO WITH VIC = 0 V
(b) VIO WITH VIC = 4 V
Figure 1. Method for Verifying That Input Offset Voltage Is Within Specified Limits
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