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TPS25810-Q1 Datasheet, PDF (6/37 Pages) Texas Instruments – USB Type-C DFP Controller and Power Switch With Load Detection
TPS25810-Q1
SLVSD95 – NOVEMBER 2016
www.ti.com
6.4 Thermal Information
THERMAL METRIC(1)
TPS25810-Q1
RVC (WQFN)
UNIT
20 PINS
RθJA
RθJC(top)
RθJB
ψJT
ψJB
RθJC(bot)
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
39.3
°C/W
43.4
°C/W
13
°C/W
0.7
°C/W
13
°C/W
4.2
°C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.5 Electrical Characteristics
–40°C ≤ TJ ≤ 125°C, 4.5 V ≤ VIN1 ≤ 6.5 V, 4.5 V ≤ VIN2 ≤ 5.5 V, 2.9 V ≤ VAUX ≤ 5.5 V; VEN = VCHG = VCHG_HI = VAUX, RREF =
100 kΩ. Typical values are at 25°C. All voltages are with respect to GND. IOUT and IOS defined positive out of the indicated pin
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
OUT – POWER SWITCH
rDS(on)
On-resistance (1)
IREV
OUT to IN reverse leakage current
OUT – CURRENT LIMIT
TJ = 25°C, IOUT = 3 A
–40°C ≤ TJ ≤ 85°C, IOUT = 3 A
–40°C ≤ TJ ≤ 125°C, IOUT = 3 A
VOUT = 6.5 V, VIN1 = VEN = 0 V,
–40°C ≤ TJ ≤ 85°C,
IREV is current out of IN1 pin
34
37
34
46 mΩ
34
55
0
3 µA
VCHG = 0 V or VCHG = VAUX and VCHG_HI =
0V
1.58
1.7 1.82
IOS
Short circuit current limit (1)
3.16
3.4 3.64
A
RREF = 10 Ω
7
OUT – DISCHARGE
REF
Discharge resistance
Bleed discharge resistance
VOUT = 4 V, UFP signature removed from
CC lines, time < tw_DCHG
VOUT = 4 V, No UFP signature on CC lines,
time > tw_DCHG
400
500
600
Ω
100
150
250
kΩ
VO
IOS
FAULT
Output voltage
Short circuit current
RREF = 10 Ω
0.78
0.8 0.82
V
9.5
15.3 µA
VOL
IOFF
LD_DET
Output low voltage
Off-state leakage
IFAULT = 1 mA
VFAULT = 5.5 V
350 mV
1 µA
VOL
Output low voltage
ILD_DET = 1 mA
IOFF
Off-state leakage
VLD_DET = 5.5 V
ITH
OUT sourcing, rising threshold
current for load detect
Hysteresis (2)
1.8 1.95
125
350 mV
1 µA
2.1
A
mA
(1) Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account
separately.
(2) These parameters are provided for reference only and do not constitute part of TI’s published specifications for purposes of TI’s product
warranty.
6
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