TLC372-EP_14 Datasheet, PDF (6/18 Pages) Texas Instruments – LinCMOS™ DUAL DIFFERENTIAL COMPARATORS

TLC372-EP
LinCMOS™ DUAL DIFFERENTIAL COMPARATORS
SGLS385 – MARCH 2007
www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
Response time is defined as the interval between the application of an input step function and the instant when
the output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the
leading edge of the input pulse, while response time, high-to-low-level output, is measured from the trailing edge
of the input pulse. Response-time measurement at low input signal levels can be greatly affected by the input
offset voltage. The offset voltage should be balanced by the adjustment at the inverting input as shown in
Figure 3, so that the circuit is just at the transition point. Then a low signal, for example 105-mV or 5-mV
overdrive, causes the output to change state.
V_DD
Pulse
Generator
1V
Input Offset Voltage
Compensation Adjustment
- 1V
10 Ω
10 Turn
DUT
50 Ω
1 kΩ
0.1 µF
TEST CIRCUIT
5.1 kΩ
1 µF
C_L
(see Note A)
Overdrive
Input
100 mV
100 mV
Input
Overdrive
Low-to-High-
Level Output
90%
50%
10%
High-to-Low-
Level Output
90%
50%
10%
t_r
t_PLH
t_f
t_PHL
NOTE: A. C_L includes probe and jig capacitance
VOLTAGE WAVEFORMS
Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms
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