DS1631_11 Datasheet, PDF (5/10 Pages) Texas Instruments – CMOS Dual Peripheral Drivers

Test Circuits (Continued)
Each input is tested separately
FIGURE 2 I_IH
TL F 5816 – 10
te _{TL F 5816–11}
Note A Each input is tested separately
Note B When testing DS1633 and DS1634 input not under test is grounded
le For all other circuits it is at VCC
FIGURE 3 I_IL
TL F 5816 – 12
Both gates are tested simultaneously
FIGURE 4 I_CC for AND and NAND Circuits
Obso ^{Schematic Diagram (EquivalentCircuit)}
TL F 5816 – 15
4