BQ500414Q Datasheet, PDF (5/34 Pages) Texas Instruments – Qi Compliant Wireless Power Transmitter Manager

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PIN
NAME
I_SENSE
LOSS_THR
LED_MODE
V_SENSE
Unused
GND
ADCREF
EPAD
NUMBER
42
43
44
45
46
47
48
49
Pin Functions (continued)
bq500414Q
SLUSBE4B – JANUARY 2014 – REVISED JUNE 2014
I/O
DESCRIPTION
I Transmitter input current, used for parasitic loss calculations. Use 40-mΩ sense resistor and A
= 50 gain current sense amp
I Input to program FOD/PMOD thresholds and FOD_CAL correction
I LED Mode Select
I Transmitter power train input voltage, used for FOD and Loss calculations.
I This pin can be either connected to GND or left open. Connecting to GND can improve layout
grounding
— GND
I External reference voltage input. Connect this input to GND.
— Flood with copper GND plane and stitch vias to PCB internal GND plane
7 Specifications
7.1 Absolute Maximum Ratings⁽¹⁾
over operating free-air temperature range (unless otherwise noted)
Voltage applied at V33D to DGND
Voltage applied at V33A to AGND
Voltage applied to any pin⁽²⁾
MIN MAX UNIT
–0.3
3.6
–0.3
3.6 V
–0.3
3.6
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages referenced to GND.
7.2 Handling Ratings
T_stg
V_(ESD) ⁽¹⁾
Storage temperature range
Human-Body Model (HBM)⁽²⁾
Charged-Device Model (CDM)⁽³⁾
MIN MAX UNIT
–40
150 °C
2
2 kV
750
750 kV
(1) Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges in
to the device.
(2) Level listed above is the passing level per ANSI, ESDA, and JEDEC JS-001. JEDEC document JEP155 states that 500-V HBM allows
safe manufacturing with a standard ESD control process.
(3) Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC document JEP157 states that 250-V CDM allows
manufacturing without risk of damaging the device with a standard ESD control process.
Copyright © 2014, Texas Instruments Incorporated
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