TLC393-Q1_14 Datasheet, PDF (4/21 Pages) Texas Instruments – DUAL MICROPOWER LinCMOS™ VOLTAGE COMPARATOR

TLC393-Q1
SGLS198B – SEPTEMBER 2004 – REVISED MAY 2013
PARAMETER MEASUREMENT INFORMATION
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The TLC393 contains a digital output stage which, if held in the linear region of the transfer curve, can cause
damage to the device. Conventional operational amplifier/comparator testing incorporates the use of a servo loop
that is designed to force the device output to a level within this linear region. Since the servo-loop method of
testing cannot be used, the following alternatives for testing parameters such as input offset voltage, common-
mode rejection ratio, etc., are suggested.
To verify that the input offset voltage falls within the limits specified, the limit value is applied to the input as
shown in Figure 1(a). With the noninverting input positive with respect to the inverting input, the output should be
high. With the input polarity reversed, the output should be low.
A similar test can be made to verify the input offset voltage at the common-mode extremes. The supply voltages
can be slewed as shown in Figure 1(b) for the V_ICR test, rather than changing the input voltages, to provide
greater accuracy.
5V
1V
+
5.1 kΩ
+
5.1 kΩ
Applied V_IO
Limit
−
V_O
Applied V_IO
Limit
−
V_O
−4V
(a) V_IO WITH V_IC = 0 V
(b) V_IO WITH V_IC = 4 V
Figure 1. Method for Verifying That Input Offset Voltage Is Within Specified Limits
A close approximation of the input offset voltage can be obtained by using a binary search method to vary the
differential input voltage while monitoring the output state. When the applied input voltage differential is equal,
but opposite in polarity, to the input offset voltage, the output changes states.
Figure 2 illustrates a practical circuit for direct dc measurement of input offset voltage that does not bias the
comparator in the linear region. The circuit consists of a switching-mode servo loop in which U1A generates a
triangular waveform of approximately 20-mV amplitude. U1B acts as a buffer, with C2 and R4 removing any
residual dc offset. The signal is then applied to the inverting input of the comparator under test, while the
noninverting input is driven by the output of the integrator formed by U1C through the voltage divider formed by
R9 and R10. The loop reaches a stable operating point when the output of the comparator under test has a duty
cycle of exactly 50%, which can only occur when the incoming triangle wave is sliced symmetrically or when the
voltage at the noninverting input exactly equals the input offset voltage.
The voltage divider formed by R9 and R10 provides an increase in input offset voltage by a factor of 100 to make
measurement easier. The values of R5, R8, R9, and R10 can significantly influence the accuracy of the reading;
therefore, it is suggested that their tolerance level be 1% or lower.
Measuring the extremely low values of input current requires isolation from all other sources of leakage current
and compensation for the leakage of the test socket and board. With a good picoammeter, the socket and board
leakage can be measured with no device in the socket. Subsequently, this open-socket leakage value can be
subtracted from the measurement obtained with a device in the socket to obtain the actual input current of the
device.
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