TCAN1042H Datasheet, PDF (4/32 Pages) Texas Instruments – Fault Protected CAN Tranceiver

TCAN1042H, TCAN1042HG
TCAN1042HGV, TCAN1042HV
SLLSES7 – FEBRUARY 2016
www.ti.com
7 Specifications
7.1 Absolute Maximum Ratings^{(1) (2)}
V_CC
V_IO
V_BUS
V_{(Logic_Input)}
V_{(Logic_Output)}
I_O(RXD)
T_J
5V bus supply voltage range
I/O Level Shifting Voltage Range
Devices with the "V" suffix
CAN Bus I/O voltage range (CANH,
CANL)
Devices with the "H" suffix
Logic input terminal voltage range (TXD, STB)
Logic output terminal voltage range (RXD)
RXD (Receiver) output current
Operating virtual junction temperature range (see Thermal
Information)
MIN
–0.3
–0.3
-70
–0.3
–0.3
-8
–55
MAX
+7
+7
+70
+7 and V_I ≤ V_IO + 0.3
+7 and V_I ≤ V_IO + 0.3
+8
150
UNIT
V
mA
°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to ground terminal.
7.2 ESD Ratings
Human Body Model (HBM) ESD stress voltage
Charged Device Model (CDM) ESD stress voltage
Machine Model (MM)
System Level Electro-Static Discharge (ESD)
TEST CONDITIONS
All terminals⁽¹⁾
CAN bus terminals (CANH, CANL) to GND⁽²⁾
All terminals⁽³⁾
All terminals⁽⁴⁾
CAN bus terminals
(CANH, CANL) to
GND
IEC 61400-4-2: Unpowered Air
Discharge
IEC 61400-4-2: Powered on
Contact Discharge
(1) Tested in accordance to JEDEC Standard 22, Test Method A114.
(2) Test method based upon JEDEC Standard 22 Test Method A114, CAN bus is stressed with respect to GND.
(3) Tested in accordance to JEDEC Standard 22, Test Method C101.
(4) Tested in accordance to JEDEC Standard 22, Test Method A115.
VALUE
±6000
±10000
±750
±200
±15000
±8000
UNIT
V
V
V
4
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