SM73710 Datasheet, PDF (4/12 Pages) Texas Instruments – SM73710 2.7V, SOT-23 Temperature Sensor

Absolute Maximum Ratings (Note 1)
Supply Voltage
Output Voltage
Output Current
Input Current at any pin (Note 2)
ESD Susceptibility (Note 3) :
Human Body Model
Machine Model
+12V to −0.2V
(+V_S + 0.6V) to
−0.6V
10 mA
5 mA
2500V
250V
Storage Temperature
Maximum Junction Temperature
(T_JMAX)
−65°C to +150°C
+125°C
Operating Ratings (Note 1)
Specified Temperature Range:
SM73710
Supply Voltage Range (+V_S)
Thermal Resistance, θ_JA (Note 5)
 T_MIN ≤ T_A ≤ T_MAX
−40°C ≤ T_A ≤ +125°C
+2.7V to +10V
450°C/W
Soldering process must comply with National
Semiconductor's Reflow Temperature Profile specifications.
Refer to www.national.com/packaging. (Note 4)
Electrical Characteristics
Unless otherwise noted, these specifications apply for +V_S = +3.0 V_DC and I _LOAD = 1 μA. Boldface limits apply for T_A = T_J =
T_MIN to T_MAX ; all other limits T_A = T_J = 25°C.
Parameter
Conditions
Typical
(Note 6)
Limits
(Note 7)
Units
(Limit)
Accuracy (Note 8)
±3.0
°C (max)
±4.0
°C (max)
Output Voltage at 0°C
+424
mV
Nonlinearity (Note 9)
±0.8
°C (max)
Sensor Gain
(Average Slope)
+6.25
+6.00
+6.50
mV/°C (min)
mV/°C (max)
Output Impedance
800
Ω (max)
Line Regulation (Note 10)
Quiescent Current
+3.0V ≤ +V _S ≤ +10V
+2.7V ≤ +V _S ≤ +3.3V
+2.7V ≤ +V _S ≤ +10V
±0.3
mV/V (max)
±2.3
mV (max)
82
110
125
μA (max)
μA (max)
Change of Quiescent Current
+2.7V ≤ +V _S ≤ +10V
±5.0
Temperature Coefficient of
0.2
Quiescent Current
μA (max)
μA/°C
Long Term Stability (Note 11)
T _J=T_MAX=+125°C, for
±0.2
°C
1000 hours
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: When the input voltage (V_I) at any pin exceeds power supplies (V_I < GND or V_I > +V_S), the current at that pin should be limited to 5 mA.
Note 3: The human body model is a 100 pF capacitor discharged through a 1.5 kΩ resistor into each pin. The machine model is a 200 pF capacitor discharged
directly into each pin.
Note 4: Reflow temperature profiles are different for lead-free and non-lead-free packages.
Note 5: The junction to ambient thermal resistance (θ_JA) is specified without a heat sink in still air.
Note 6: Typicals are at T_J = T_A = 25°C and represent most likely parametric norm.
Note 7: Limits are guaranteed to National's AOQL (Average Outgoing Quality Level).
Note 8: Accuracy is defined as the error between the output voltage and +6.25 mV/°C times the device's case temperature plus 424 mV, at specified conditions
of voltage, current, and temperature (expressed in °C).
Note 9: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's rated temperature
range.
Note 10: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance.
Note 11: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least
46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur.
The majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate.
3
www.national.com