LMP7711 Datasheet, PDF (4/26 Pages) National Semiconductor (TI) – Precision, 17 MHz, Low Noise, CMOS Input Amplifier

LMP7711
SNOSAP4F – SEPTEMBER 2005 – REVISED MAY 2013
www.ti.com
2.5V ELECTRICAL CHARACTERISTICS (continued)
Unless otherwise noted, all limits are ensured for T_A = 25°C, V⁺ = 2.5V, V^− = 0V ,V_O = V_CM = V⁺/2, V_EN = V⁺. Boldface limits
apply at the temperature extremes.
Symbol
Parameter
Conditions
Min ⁽¹⁾
Typ ⁽²⁾
Max ⁽¹⁾
Units
GBW Gain Bandwidth
14
MHz
e_n
Input Referred Voltage Noise Density f = 400 Hz
f = 1 kHz
6.8
nV/√Hz
5.8
i_n
Input Referred Current Noise Density
t_on
Turn-on Time
t_off
Turn-off Time
V_EN
Enable Pin Voltage Range
I_EN
Enable Pin Input Current
THD+N Total Harmonic Distortion + Noise
f = 1 kHz
Enable Mode
Shutdown Mode
V_EN = 2.5V⁽⁵⁾
V_EN = 0V⁽⁵⁾
f = 1 kHz, A_V = 1, R_L = 100 kΩ
V_O = 0.9 V_PP
f = 1 kHz, A_V = 1, R_L = 600Ω
V_O = 0.9 V_PP
0.01
pA/√Hz
140
ns
1000
ns
2.1
2 - 2.5
V
0 - 0.5
0.4
1.5
3.0
μA
0.003
0.1
0.003
%
0.004
5V ELECTRICAL CHARACTERISTICS
Unless otherwise noted, all limits are ensured for T_A = 25°C, V⁺ = 5V, V^− = 0V, V_CM = V⁺/2, V_EN = V⁺. Boldface limits apply at
the temperature extremes.
Symbol
Parameter
Conditions
Min ⁽¹⁾
Typ ⁽²⁾
Max ⁽¹⁾
Units
V_OS
Input Offset Voltage
±10
±150
±450
μV
TC V_OS Input Offset Voltage Temperataure
Drift ^{(3) (4)}
I_B
Input Bias Current
I_OS
Input Offset Current
LMP7711
LMP7712
V_CM = 2.0V ^{(5) (4)}
−40°C ≤ TA ≤ 85°C
−40°C ≤ TA ≤ 125°C
V_CM = 2.0V⁽⁴⁾
–1.75
–1
0.1
0.1
0.01
±4
μV/°C
1
25
pA
1
100
0.5
50
pA
CMRR Common Mode Rejection Ratio
PSRR Power Supply Rejection Ratio
CMVR Common Mode Voltage Range
0V ≤ V_CM ≤ 3.7V
2.0V ≤ V⁺ ≤ 5.5V
V^− = 0V, V_CM = 0
1.8V ≤ V⁺ ≤ 5.5V
V^− = 0V, V_CM = 0
CMRR ≥ 80 dB
CMRR ≥ 78 dB
85
100
82
dB
85
100
80
dB
85
98
−0.3
–0.3
4
4
V
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using the
Statistical Quality Control (SQC) method.
(2) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(3) Offset voltage average drift is determined by dividing the change in V_OS at the temperature extremes by the total temperature change.
(4) This parameter is specified by design and/or characterization and is not tested in production.
(5) Positive current corresponds to current flowing into the device.
4
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