English
Language : 

DS96F173MQML_13 Datasheet, PDF (4/14 Pages) Texas Instruments – DS96F173MQML/DS96F175MQML EIA-485/EIA-422 Quad Differential Receivers
◁
DS96F173MQML, DS96F175MQML
SNOSAS9A – APRIL 2011 – REVISED APRIL 2013
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings(1)
Storage Temperature Range(TStg)
Lead Temperature (Soldering, 60 sec.)
Max. Package Power Dissipation at 25°C(2)
Supply Voltage
Input Voltage, A or B Inputs
Differential Input Voltage
Enable Input Voltage
Low Level Output Current
CDIP (NFE)
CDIP (NAD)
LCCC (NAJ)
−65°C ≤ TA ≤ +175°C
300°C
1,500 mW
1,034 mW
1,500 mW
7.0V
±25V
±25V
7.0V
50 mA
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics--DC Parameters. The ensured specifications apply only for the test conditions listed. Some performance
characteristics may degrade when the device is not operated under the listed test conditions.
(2) Above TA = 25°C derate NFE package 10 mW/°C, NAD package 6.90 mW/°C, NAJ package 11.11 mW/°C.
Recommended Operating Conditions
Supply Voltage (VCC)
Common Mode Input Voltage (VCM)
Differential Input Voltage (VID)
Output Current HIGH (IOH)
Output Current LOW (IOL)
Operating Temperature (TA)
Min
Max
Units
4.50
5.50
V
−7
+12
V
−7
+12
V
−400
μA
16
mA
−55
125
°C
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
1
2
3
4
5
6
7
8A
8B
9
10
11
12
13
14
Description
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Settling time at
Settling time at
Settling time at
Temp (°C)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
4
Submit Documentation Feedback
Copyright © 2011–2013, Texas Instruments Incorporated
Product Folder Links: DS96F173MQML DS96F175MQML
 ▷