THS770012 Datasheet, PDF (3/35 Pages) Texas Instruments – Broadband, Fully-Differential, 14-/16-Bit ADC Driver Amplifier

THS770012
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SLOS669C – FEBRUARY 2010 – REVISED JANUARY 2012
THERMAL INFORMATION
THERMAL METRIC⁽¹⁾
THS770012
RGE (24) PINS
UNITS
θ_JA
θ_JC(top)
θ_JB
ψ_JT
ψ_JB
θ_JC(bottom)
Junction-to-ambient thermal resistance
Junction-to-case(top) thermal resistance
Junction-to-board thermal resistance
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case(bottom) thermal resistance
44.1
35
19
°C/W
0.5
18.8
8.9
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
ELECTRICAL CHARACTERISTICS
Test conditions are at T_A = +25°C, V_S+ = +5V, V_OCM = +2.5V, V_OUT = 2V_PP, R_L = 400Ω differential, G = +12dB, differential input
and output, and input and output referenced to midsupply, unless otherwise noted. Measured using evaluation module as
discussed in Test Circuits section.
PARAMETER
TEST CONDITIONS
AC PERFORMANCE
Small-signal bandwidth
Large-signal bandwidth
Bandwidth for 0.1dB flatness
Slew rate
Rise time
Fall time
Settling time to 0.1%
Input return loss, s11
Gain = +10dB, V_OUT = 200mV_PP
Gain = +11dB, V_OUT = 200mV_PP
Gain = +12dB, V_OUT = 200mV_PP
Gain = +13.7dB, V_OUT = 200mV_PP
Gain = +10dB, V_OUT = 2V_PP
Gain = +11dB, V_OUT = 2V_PP
Gain = +12dB, V_OUT = 2V_PP
Gain = +13.7dB, V_OUT = 2V_PP
Gain = +12dB, V_OUT = 2V_PP
V_OUT = 2V step
V_OUT = 4V step
V_OUT = 2V step
V_OUT = 2V step
V_OUT = 2V step
See s-Parameters section, f < 200MHz
Output return loss, s22
See s-Parameterssection, f < 200MHz
Reverse isolation, s12
See s-Parameters section, f < 200MHz
Second-order harmonic
distortion, Gain = +12dB, R_L =
400Ω, V_OUT = 2V_PP
f = 10MHz
f = 50MHz
f = 100MHz
f = 200MHz
Third-order harmonic distortion,
Gain = +12dB, R_L = 400Ω, V_OUT
= 2V_PP
f = 10MHz
f = 50MHz
f = 100MHz
f = 200MHz
Second-order intermodulation
distortion, Gain = +12dB, R_L =
400Ω, V_OUT = 2V_PP
f = 50MHz, 10MHz spacing
f = 100MHz, 10MHz spacing
f = 150MHz, 10MHz spacing
f = 200MHz, 10MHz spacing
MIN
TYP
MAX
UNIT
TEST
LEVEL ⁽¹⁾
900
810
680
540
845
790
680
548
130
3300
3400
0.6
0.6
2.2
–18
–16
–60
–90
–70
–73
–74
–100
–85
–84
–73
–62
–76
–78
–78
MHz
C
MHz
C
MHz
C
MHz
C
MHz
C
MHz
C
MHz
C
MHz
C
MHz
C
V/µs
C
V/µs
C
ns
C
ns
C
ns
C
dB
C
dB
C
dB
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
dBc
C
(1) Test levels: (A) 100% tested at +25°C. Over-temperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
Copyright © 2010–2012, Texas Instruments Incorporated
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