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SN74LVTH18646A-EP Datasheet, PDF (3/41 Pages) Texas Instruments – 3.3-V ABT SVAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN74LVTH18646AĆEP, SN74LVTH182646AĆEP
3.3ĆV ABT SCAN TEST DEVICES
WITH 18ĆBIT TRANSCEIVERS AND REGISTERS
SCAS745A − DECEMBER 2003 − REVISED APRIL 2004
PM PACKAGE
(TOP VIEW)
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
VCC
2A1
2A2
2A3
GND
2A4
2A5
2A6
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
1B4
1B5
1B6
GND
1B7
1B8
1B9
VCC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
FUNCTION TABLE
(normal mode, each 9-bit section)
INPUTS
DATA I/O
OE
DIR CLKAB CLKBA SAB SBA
A1−A9
B1−B9
X
X
↑
X
X
X
Input
Unspecified†
X
X
X
↑
X
X
Unspecified†
Input
OPERATION OR FUNCTION
Store A, B unspecified†
Store B, A unspecified†
H
X
↑
↑
X
X
Input
Input
Store A and B data
H
X
H or L H or L
X
X
Input disabled Input disabled
Isolation, hold storage
L
L
X
X
X
L
Output
Input
Real-time B data to A bus
L
L
X
H or L
X
H
Output
Input disabled
Stored B data to A bus
L
H
X
X
L
X
Input
Output
Real-time A data to B bus
L
H
H or L
X
H
X
Input disabled
Output
Stored A data to B bus
† The data-output functions can be enabled or disabled by various signals at OE and DIR. Data-input functions always are enabled; i.e., data at
the bus terminals is stored on every low-to-high transition of the clock inputs.
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