SN55HVD75-EP Datasheet, PDF (3/32 Pages) Texas Instruments – 3.3-V Supply RS-485 With IEC ESD Protection

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5 Pin Configuration and Functions
SN55HVD75-EP
SLOS913 – OCTOBER 2015
DRB Package
8-Pin VSON
Top View
R
1
RE
2
DE
3
8
V_CC
7B
6A
D
4
5 GND
NAME
A
B
D
DE
GND
R
RE
V_CC
PIN
NO.
6
7
4
3
5
1
2
8
TYPE
Bus I/O
Bus I/O
Digital input
Digital input
Reference potential
Digital output
Digital input
Supply
Pin Functions
DESCRIPTION
Driver output or receiver input (complementary to B)
Driver output or receiver input (complementary to A)
Driver data input
Active-high driver enable
Local device ground
Receive data output
Active-low receiver enable
3-V to 3.6-V supply
6 Specifications
6.1 Absolute Maximum Ratings
over recommended operating range (unless otherwise specified) ⁽¹⁾
MIN
MAX
UNIT
Supply voltage, V_CC
Voltage at A or B inputs
–0.5
5.5
V
–13
16.5
V
Input voltage at any logic pin
–0.3
5.7
V
Voltage input, transient pulse, A and B, through 100 Ω
–100
100
V
Receiver output current
–24
24
mA
Junction temperature, T_J
Storage temperature, T_stg
170
°C
–65
150
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings
V_(ESD)
Electrostatic
discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 ⁽¹⁾
Charged device model (CDM), per JEDEC specification
JESD22-C101 ⁽²⁾
JEDEC standard 22, test method A115 (machine model)
IEC 61000-4-2 ESD (air-gap discharge)⁽³⁾
IEC 61000-4-2 ESD (contact discharge)
IEC 61000-4-4 EFT (fast transient or burst)
IEC 60749-26 ESD HBM
All pins
All pins
All pins
Pins 5 to 7
Pins 5 to 7
Pins 5 to 7
Pins 5 to 7
VALUE
±8000
±1500
±300
±12000
±12000
±4000
±15000
UNIT
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(3) By inference from contact discharge results, see Application and Implementation.
Copyright © 2015, Texas Instruments Incorporated
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