LMP7300_14 Datasheet, PDF (3/18 Pages) Texas Instruments – Micropower Precision Comparator and Precision Reference with Adjustable Hysteresis

LMP7300
www.ti.com
SNOSAT7F – AUGUST 2007 – REVISED MARCH 2013
2.7V Electrical Characteristics⁽¹⁾
Unless otherwise specified, all limits are ensured for T_A = 25°C, V⁺ = 2.7V, V^− = 0V, and V_CM = V⁺/2, R_PULLUP = 100 kΩ, C_LOAD
= 10 pF. Boldface limits apply at the temperature extremes.
Symbol
Parameter
Conditions
Min ⁽²⁾
Typ ⁽³⁾
Max ⁽²⁾
Units
I_S
Supply Current
R_PULLUP = Open
9
12
17
μA
Comparator
V_OS
Input Offset Voltage
TCV_OS
I_B
Input Offset Average Drift
Input Bias Current⁽⁵⁾
V_CM = V⁺/2 SOIC
V_CM = V⁺/2 VSSOP
See ⁽⁴⁾
|V_ID| < 2.5V
±0.07
±0.07
1.8
1.2
±0.75
±2
±1.0
±2.2
3
4
mV
mV
μV/°C
nA
I_OS
CMRR
PSRR
Input Offset Current
Common Mode Rejection Ratio
Power Supply Rejection Ratio
1V < V_CM < 2.7V
V⁺ = 2.7V to 12V
0.15
0.5
nA
80
100
dB
80
100
dB
V_OL
Output Low Voltage
I_LOAD = 10 mA
0.25
0.4
0.5
V
I_LEAK
HC_LIN
I_HYS
Output Leakage Current
Hysteresis Control Voltage
Linearity
Hysteresis Leakage Current
Comparator Output in High State
0 < Ref-H_YSTP,N < 25 mV
25 mV < Ref-H_YSTP,N < 100 mV
1
pA
1.000
0.950
mV/V
1.2
3
4
nA
T_PD
Propagation Delay
(High to Low)
Reference
Overdrive = 10 mV, C_L = 10 pF
Overdrive = 100 mV, C_L = 10 pF
12
17
μs
4.5
7.6
V_O
Reference Voltage
SOIC
VSSOP
2.043
2.048
2.053
V
2.043
2.048
2.056
V
Line Regulation
Load Regulation
TCV_REF/°C Temperature Coefficient
V_N
Output Noise Voltage
V_CC = 2.7V to 12V
I_OUT = 0 to 1 mA
−40°C to 125°C
0.1 Hz to 10 Hz
10 Hz to 10 kHz
14
80
μV/V
0.2
0.5
mV/mA
55
ppm/°C
80
μV_PP
100
μV_RMS
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T_J > T_A.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4) Offset voltage average drift determined by dividing the change in V_OS at temperature extremes, by the total temperature change.
(5) Positive current corresponds to current flowing into the device.
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