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LMH6704 Datasheet, PDF (3/20 Pages) National Semiconductor (TI) – 650 MHz Progammable Gain Buffer with Disable
LMH6704
www.ti.com
SNOSAD0C – FEBRUARY 2005 – REVISED MARCH 2013
Electrical Characteristics (1)
TA = +25°C , AV = +2, VS = ±5V, RL = 100Ω; unless specified.
Symbol
Parameter
Conditions
Dynamic Performance
SSBW
SSBW
LSBW
GF0.1dB
SR
TRS/TRL
-3 dB Bandwidth
0.1 dB Gain Bandwidth
Slew Rate
Rise and Fall Time
(10% to 90%)
VOUT = 0.5 VPP, AV = +1
VOUT = 0.5 VPP
VOUT = 2 VPP
VOUT = 2 VPP
VOUT = 4 VPP, 40% to 60% (3)
2V Step
ts
Settling Time to 0.1%
Distortion and Noise Response
HD2L
2nd Harmonic Distortion
HD2H
HD3L
3rd Harmonic Distortion
HD3H
IMD
Two-Tone Intermodulation
VN
Output Noise Voltage
INN
Non-Inverting Input Noise Current
DG
Differential Gain
DP
Differential Phase
Static, DC Performance
2V Step
VOUT = 2.0 VPP, f = 10 MHz
VOUT = 2.0 VPP, f = 40 MHz
VOUT = 2.0 VPP, f = 10 MHz
VOUT = 2.0 VPP, f = 40 MHz
f = 10 MHz, POUT = 10 dBm/tone
AV = +2
f = 100 kHz
AV = +1
AV = −1
RL = 150Ω, f = 4.43 MHz
RL = 150Ω, f = 4.43 MHz
AV
Gain
Gain Error
VIO
DVIO
IBN
IBI
CMIR
PSRR
Input Offset Voltage
Input Offset Voltage Average Drift
Input Bias Current
Non-Inverting (4)
Input Bias Current
Common Mode Input Range
Power Supply Rejection Ratio
Inverting
VIO ≤ 15 mV
DC
VO
Output Voltage Swing
IO
Linear Output Current
Supply Current (Enabled)
IS
Supply Current (Disabled)
RL = ∞
RL = 100Ω
VOUT ≤ 80 mV
DIS = 2V, RL = ∞
DIS = 0.8V, RL = ∞
Min (2)
1.98
1.96
−1
−2
±1.9
48
47
±3.3
±3.18
±3.2
±3.12
±55
Typ (2) Max (2)
650
450
400
200
3000
0.9
10
−62
−52
−78
−65
−65
10.5
9.3
10.5
3
.02
0.02
2.00
2.02
2.04
+1
+2
2
±7
±8.3
35
−5
±15
±18
5
±22
±31
±2
52
±3.5
±3.5
±90
11.5
12.5
13.7
0.25
0.9
0.925
Units
MHz
MHz
V/µs
ns
ns
dBc
dBc
dBc
nV/√Hz
pA/√Hz
%
deg
V/V
%
mV
μV/°C
μA
V
dB
V
mA
mA
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. Parametric performance is indicated in the electrical tables under conditions of
internal self-heating where TJ > TA. Min/Max ratings are based on production testing unless otherwise specified.
(2) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested on shipped production material.
(3) Slew Rate is the average of the rising and falling edges.
(4) Negative current implies current flowing out of the device.
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