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LMC7211-N_14 Datasheet, PDF (3/23 Pages) Texas Instruments – LMC7211 Tiny CMOS Comparator with Rail-to-Rail Input and Push-Pull Output
LMC7211-N
www.ti.com
SNOS746F – MAY 2004 – REVISED JANUARY 2013
2.7V Electrical Characteristics (continued)
Unless otherwise specified, all limits guaranteed for TJ = 25°C, V+ = 2.7V, V− = 0V, VCM = VO = V+/2. Boldface limits apply at
the temperature extremes.
Symbol
Parameter
Conditions
Typ (1)
LMC7211AI
Limit (2)
LMC7211BI
Limit (2)
Units
CMVR
Input Common-Mode Voltage CMRR > 55 dB
Range
3.0
2.9
2.7
2.9
V
2.7
min
CMRR > 55 dB
−0.3
−0.2
0.0
−0.2
V
0.0
max
VOH
Output Voltage High
Iload = 2.5 mA
2.5
2.4
2.3
2.4
V
2.3
min
VOL
Output Voltage Low
Iload = 2.5 mA
0.2
0.3
0.4
0.3
V
0.4
max
IS
Supply Current
VOUT = Low
7
12
12
μA
14
14
max
5.0V and 15.0V Electrical Characteristics
Unless otherwise specified, all limits guaranteed for TJ = 25°C, V+ = 5.0V and 15V, V− = 0V, VCM = VO = V+/2. Boldface limits
apply at the temperature extremes.
Symbol
Parameter
Conditions
Typ (1)
LMC7211AI
Limit (2)
LMC7211BI
Limit (2)
Units
VOS
TCVOS
Input Offset Voltage
Input Offset Voltage
Temperature Drift
Input Offset Voltage Average
Drift
V+ = 5V
V+ = 15V
V+ = 5V
V+ = 15V
3
5
15
mV
8
18
max
1.0
μV/°C
4.0
3.3
μV/Month
4.0
IB
Input Current
0.04
pA
IOS
Input Offset Current
0.02
pA
CMRR
Common Mode
V+ = 5.0V
75
dB
Rejection Ration
V+ = 15.0V
82
dB
PSRR
Power Supply
Rejection Ratio
5V ≤ V+ ≤ 10V
80
dB
AV
CMVR
Voltage Gain
Input Common-Mode
Voltage Range
V+ = 5.0V
CMRR > 55 dB
100
dB
5.3
5.2
5.2
V
5.0
5.0
min
V+ = 5.0V
CMRR > 55 dB
−0.3
−0.2
−0.2
V
0.0
0.0
max
V+ = 15.0V
CMRR > 55 dB
15.3
15.2
15.2
V
15.0
15.0
min
V+ = 15.0V
CMRR > 55 dB
−0.3
−0.2
−0.2
V
0.0
0.0
max
VOH
Output Voltage High
VOL
Output Voltage Low
IS
Supply Current
V+ = 5V
Iload = 5 mA
V+ = 15V
Iload = 5 mA
V+ = 5V
Iload = 5 mA
V+ = 15V
Iload = 5 mA
VOUT = Low
4.8
4.6
4.6
V
4.45
4.45
min
14.8
14.6
14.6
V
14.45
14.45
min
0.2
0.40
0.40
V
0.55
0.55
max
0.2
0.40
0.40
V
0.55
0.55
max
7
14
14
μA
18
18
max
(1) Typical values represent the most likely parametric norm.
(2) All limits are guaranteed by testing or statistical analysis.
Copyright © 2004–2013, Texas Instruments Incorporated
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